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Analysis of Threshold Voltage Shift for Full VGS/VDS/Oxygen-Content Span under Positive Bias Stress in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors
 
 

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Journal: Micromachines, 2021
Volume: 12
Number: 434

Article: Light Emitted Diode on Detecting Thin-Film Transistor through Line-Scan Photosensor
Authors: by Fu-Ming Tzu, Jung-Shun Chen and Shih-Hsien Hsu
Link: https://www.mdpi.com/2072-666X/12/4/434

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