Correction: Park, J.; et al. Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop. Micromachines 2019, 10, 411
Reference
- Park, J.; Yim, Y.U. Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop. Micromachines 2019, 10, 411. [Google Scholar] [CrossRef] [Green Version]
© 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Share and Cite
Park, J.; Yim, Y.U. Correction: Park, J.; et al. Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop. Micromachines 2019, 10, 411. Micromachines 2020, 11, 11. https://doi.org/10.3390/mi11010011
Park J, Yim YU. Correction: Park, J.; et al. Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop. Micromachines 2019, 10, 411. Micromachines. 2020; 11(1):11. https://doi.org/10.3390/mi11010011
Chicago/Turabian StylePark, Jaeyoung, and Young Uk Yim. 2020. "Correction: Park, J.; et al. Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop. Micromachines 2019, 10, 411" Micromachines 11, no. 1: 11. https://doi.org/10.3390/mi11010011
APA StylePark, J., & Yim, Y. U. (2020). Correction: Park, J.; et al. Fine-Grained Power Gating Using an MRAM-CMOS Non-Volatile Flip-Flop. Micromachines 2019, 10, 411. Micromachines, 11(1), 11. https://doi.org/10.3390/mi11010011