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Journal: Micromachines, 2019
Volume: 10
Number: 637

Article: Electrical Coupling and Simulation of Monolithic 3D Logic Circuits and Static Random Access Memory
Authors: by Tae Jun Ahn, Bum Ho Choi, Sung Kyu Lim and Yun Seop Yu
Link: https://www.mdpi.com/2072-666X/10/10/637

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