Order Article Reprints

Su W-H, Zhang J, Yang C, Page R, Szinyei T, Hirsch CD, Steffenson BJ. Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision. Remote Sensing. 2021; 13(1):26. https://doi.org/10.3390/rs13010026

Su, Wen-Hao, Jiajing Zhang, Ce Yang, Rae Page, Tamas Szinyei, Cory D. Hirsch, and Brian J. Steffenson. 2021. "Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision" Remote Sensing 13, no. 1: 26. https://doi.org/10.3390/rs13010026

Su, W.-H., Zhang, J., Yang, C., Page, R., Szinyei, T., Hirsch, C. D., & Steffenson, B. J. (2021). Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision. Remote Sensing, 13(1), 26. https://doi.org/10.3390/rs13010026