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Journal: Remote Sens., 2020
Volume: 12
Number: 3471

Article: High-Resolution Soybean Yield Mapping Across the US Midwest Using Subfield Harvester Data
Authors: by Walter T. Dado, Jillian M. Deines, Rinkal Patel, Sang-Zi Liang and David B. Lobell
Link: https://www.mdpi.com/2072-4292/12/21/3471

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