The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature
Abstract
1. Introduction
2. Materials and Methods
2.1. Experimental Methods for Voltage Divider and Its Insulating Materials
2.1.1. Breakdown Strength Testing of Insulating Materials
2.1.2. Surface Potential Decay Test
2.1.3. Dielectric Spectroscopy Test
2.1.4. Temperature Rise Test
2.2. Simulation of Temperature Rise in the Core of Voltage Divider
3. Results and Discussions
3.1. The Breakdown and Flashover of Insulating Materials
3.2. The Dielectric Properties and Trap Characteristics of Insulating Materials
3.3. Analysis of XRD Testing Results
3.4. The Spatial and Temporal Distribution of Electric Field and Temperature in the Core of Voltage Divider
3.4.1. The Experimental Results
3.4.2. The Simulated Results
3.5. The Failure Mechanism of Voltage Divider Induced by Insulating Material Degradation Under High Frequency Voltage
4. Conclusions
- (1)
- High-frequency harmonic voltages significantly degrade the insulation strength of materials used in DC voltage dividers. Compared with power frequency conditions, the bulk breakdown strength of polypropylene laminated paper decreases by over 50% under a 10 kHz high-frequency voltage. Furthermore, the surface flashover voltage in oil is reduced by 17.7% under high-frequency voltage alone, and by as much as 51% when white flocculent substances are present in the oil.
- (2)
- Due to the increase in dielectric constant and dielectric loss with rising temperatures at a fixed voltage frequency, the temperature of the insulating material used in the voltage divider continues to rise under high-frequency voltage because of the mutual feedback cycle between the increased dielectric loss and temperature. This leads to changes in the crystalline characteristics of polypropylene, which in turn results in variations in its trap properties. As a result, the traps of materials in the voltage divider exhibit substantially deeper trap energy levels and higher trap densities, enhancing charge capture and hindering carrier transport, which reduce the insulation properties.
- (3)
- Electro-thermal coupling induces a considerable temperature rise and material degradation in the voltage divider core. Under a 25 kHz high-frequency voltage, the capacitor core temperature rises rapidly because of dielectric loss, reaching up to 98 °C, which results in oil turbidity and the precipitation of white substances. Finite element simulations of the temperature rise are in good agreement with experimental measurements, confirming that dielectric loss is the primary heat source.
- (4)
- A failure mechanism for voltage dividers under high-frequency voltage and temperature coupling is proposed. Prolonged electro-thermal stress induces polymer chain scission in styrene-containing materials, releasing monomers that migrate and repolymerize into white polystyrene deposits on the core surface. Owing to its porous structure and dielectric mismatch with the base insulation, this deposit causes interfacial field distortion, triggers partial discharge, and aggravates surface flashover.
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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| Component | CH4 | C2H4 | C2H6 | C2H2 | CO | CO2 | H2 |
|---|---|---|---|---|---|---|---|
| Concentration | 76.21 | 165.86 | 249.53 | 9.33 | 0 | 1908.52 | 9.93 |
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© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
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Li, X.; Zhang, C.; Liu, Z.; Song, J.; Tian, H.; Xie, Q.; Zhang, Z.; Li, S. The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature. Materials 2026, 19, 2047. https://doi.org/10.3390/ma19102047
Li X, Zhang C, Liu Z, Song J, Tian H, Xie Q, Zhang Z, Li S. The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature. Materials. 2026; 19(10):2047. https://doi.org/10.3390/ma19102047
Chicago/Turabian StyleLi, Xuan, Chuang Zhang, Zixi Liu, Jiajie Song, Huidong Tian, Qijia Xie, Zhengmao Zhang, and Shengtao Li. 2026. "The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature" Materials 19, no. 10: 2047. https://doi.org/10.3390/ma19102047
APA StyleLi, X., Zhang, C., Liu, Z., Song, J., Tian, H., Xie, Q., Zhang, Z., & Li, S. (2026). The Failure of Voltage Divider Induced by Insulating Material Degradation Under Coupling Effect of High-Frequency Field and Temperature. Materials, 19(10), 2047. https://doi.org/10.3390/ma19102047
