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Journal: MaterialsVolume: 18Number: 2395
Article: Evaluation of Physical Properties of Ti-Doped BiFeO3 Thin Films Deposited on Fluorine Tin Oxide and Indium Tin Oxide Substrates
- Authors:
- Anel Rocío Carrasco-Hernández1,
- Armando Reyes-Rojas2 and
- Gabriel Rojas-George2
- et al.
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