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Journal: Materials, 2022
Volume: 15
Number: 478

Article: Modeling of the Point Defect Migration across the AlN/GaN Interfaces—Ab Initio Study
Authors: by Roman Hrytsak, Pawel Kempisty, Ewa Grzanka, Michal Leszczynski and Malgorzata Sznajder
Link: https://www.mdpi.com/1996-1944/15/2/478

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