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Journal: Materials, 2019
Volume: 12
Number: 1102

Article: Colossal Permittivity and Low Dielectric Loss of Thermal Oxidation Single-Crystalline Si Wafers
Authors: by Yalong Sun, Di Wu, Kai Liu and Fengang Zheng
Link: https://www.mdpi.com/1996-1944/12/7/1102

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