Wan, L.; He, F.; Qin, Y.; Lin, Z.; Su, J.; Chang, J.; Hao, Y.
Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials 2018, 11, 1761.
https://doi.org/10.3390/ma11091761
AMA Style
Wan L, He F, Qin Y, Lin Z, Su J, Chang J, Hao Y.
Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials. 2018; 11(9):1761.
https://doi.org/10.3390/ma11091761
Chicago/Turabian Style
Wan, Liaojun, Fuchao He, Yu Qin, Zhenhua Lin, Jie Su, Jingjing Chang, and Yue Hao.
2018. "Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors" Materials 11, no. 9: 1761.
https://doi.org/10.3390/ma11091761
APA Style
Wan, L., He, F., Qin, Y., Lin, Z., Su, J., Chang, J., & Hao, Y.
(2018). Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials, 11(9), 1761.
https://doi.org/10.3390/ma11091761