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Materials 2018, 11(8), 1303; https://doi.org/10.3390/ma11081303

Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source

1
Institute of Optoelectronics, Military University of Technology, 2 Urbanowicza Str., 00-908 Warsaw, Poland
2
Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Břehová 7, 115 19 Praha 1 Prague, Czech Republic
3
Key Laboratory of Microstructured Materials of MOE, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
*
Author to whom correspondence should be addressed.
Received: 27 June 2018 / Revised: 13 July 2018 / Accepted: 25 July 2018 / Published: 28 July 2018
(This article belongs to the Special Issue Special Issue of the Manufacturing Engineering Society (MES))
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Abstract

We present a proof of principle experiment on single-shot near edge soft X-ray fine structure (NEXAFS) spectroscopy with the use of a laboratory laser-plasma light source. The source is based on a plasma created as a result of the interaction of a nanosecond laser pulse with a double stream gas puff target. The laser-plasma source was optimized for efficient soft X-ray (SXR) emission from the krypton/helium target in the wavelength range from 2 nm to 5 nm. This emission was used to acquire simultaneously emission and absorption spectra of soft X-ray light from the source and from the investigated sample using a grazing incidence grating spectrometer. NEXAFS measurements in a transmission mode revealed the spectral features near the carbon K-α absorption edge of thin polyethylene terephthalate (PET) film and L-ascorbic acid in a single-shot. From these features, the composition of the PET sample was successfully obtained. The NEXAFS spectrum of the L-ascorbic acid obtained in a single-shot exposure was also compared to the spectrum obtained a multi-shot exposure and to numerical simulations showing good agreement. In the paper, the detailed information about the source, the spectroscopy system, the absorption spectra measurements and the results of the studies are presented and discussed. View Full-Text
Keywords: NEXAFS; soft X-rays SXR; SXR absorption spectroscopy NEXAFS; soft X-rays SXR; SXR absorption spectroscopy
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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Wachulak, P.; Duda, M.; Fok, T.; Bartnik, A.; Wang, Z.; Huang, Q.; Sarzyński, A.; Jancarek, A.; Fiedorowicz, H. Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source. Materials 2018, 11, 1303.

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