Next Article in Journal
Study on the Degradation of Optical Silicone Exposed to Harsh Environments
Next Article in Special Issue
Introducing Obliquely Perforated Phononic Plates for Enhanced Bandgap Efficiency
Previous Article in Journal
Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source
Previous Article in Special Issue
Advanced Chemical Looping Materials for CO2 Utilization: A Review
Open AccessReview

Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

1
EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
2
Institute of Mechanics, Materials and Civil Engineering, Université catholique de Louvain, Louvain-la-Neuve 1348, Belgium
*
Author to whom correspondence should be addressed.
Materials 2018, 11(8), 1304; https://doi.org/10.3390/ma11081304
Received: 29 June 2018 / Revised: 25 July 2018 / Accepted: 26 July 2018 / Published: 28 July 2018
(This article belongs to the Special Issue State-of-the-Art Materials Science in Belgium 2017)
The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science. View Full-Text
Keywords: TEM; electron diffraction tomography; STEM; atom counting; electron tomography; compressed sensing; EDS; EELS; nanomechanical testing; ACOM TEM TEM; electron diffraction tomography; STEM; atom counting; electron tomography; compressed sensing; EDS; EELS; nanomechanical testing; ACOM TEM
Show Figures

Figure 1

MDPI and ACS Style

Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp. Materials 2018, 11, 1304.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop