Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
Abstract
:1. Introduction
- t: time to failure (TTF) (s);
- Ea: activation energy for the thermally activated process (eV);
- k: Boltzmann’s constant (8.62 × 10−5 eV/K);
- T: absolute temperature (K);
- A: pre-exponential factor (s−1).
- t1 = TTF, at T1 and V1, (s);
- t2 = TTF, at T2 and V2, (s);
- V1 and V2 = test voltages under conditions (V);
- n = voltage stress exponent;
- Ea = activation energy for dielectric wear out (eV);
- k = Boltzmann’s constant (8.62 × 10−5 eV/K);
- T1 and T2 = absolute test temperature (K).
2. Materials and Methods
2.1. Multilayer Ceramic Capacitors Preparation
2.2. Electrical Characterization
3. Results and discussion
3.1. Initial HALT Test Results
3.2. Activation Energies
3.3. Discussion on Activation Energies
4. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Element | MLCC-1 | MLCC-2 | MLCC-3 |
---|---|---|---|
Ba/Ti ratio | 2.88 | 2.86 | 2.85 |
Y wt% | 1.05 | 1.05 | 1.05 |
Ca wt% | < 0.01 (≈ 0.01 mol%) | 0.5–0.6 (≈ 2.8 mol%) | 1.3–1.5 (≈ 8.1 mol%) |
Sample Type | Time to Breakdown at 140 °C and 400 V |
---|---|
MLCC-1 | 37 h |
MLCC-2 | <1 s |
MLCC-3 | 3.5 h |
MLCCs | Ea (eV) at 400 V | Ea (eV) at 600 V | ln(A) at 400 V | ln(A) at 600 V | Temperature Range at 400 V | Temperature Range at 600 V |
---|---|---|---|---|---|---|
MLCC-1 | 1.06 ± 0.07 | 1.01 ± 0.09 | 26.96 ± 2.5 | 26.52 ± 2.1 | 140–200 °C | 120–200 °C |
MLCC-2 | 1.45 ± 0.05 | 1.08 ± 0.02 | 39.90 ± 2.9 | 38.30 ± 1.8 | 20–70 °C | 20–70 °C |
MLCC-3 | 1.25 ± 0.06 | 1.09 ± 0.02 | 33.62 ± 1.3 | 31.23 ± 0.7 | 110–200 °C | 90–180 °C |
MLCCs | n (T1 = T2) | n (All Conditions) |
---|---|---|
MLCC-1 | 5.51 | 4.46 |
MLCC-2 | 4.95 | 3.26 |
MLCC-3 | 1.93 | 5.02 |
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Hernández-López, A.M.; Aguilar-Garib, J.A.; Guillemet-Fritsch, S.; Nava-Quintero, R.; Dufour, P.; Tenailleau, C.; Durand, B.; Valdez-Nava, Z. Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT). Materials 2018, 11, 1900. https://doi.org/10.3390/ma11101900
Hernández-López AM, Aguilar-Garib JA, Guillemet-Fritsch S, Nava-Quintero R, Dufour P, Tenailleau C, Durand B, Valdez-Nava Z. Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT). Materials. 2018; 11(10):1900. https://doi.org/10.3390/ma11101900
Chicago/Turabian StyleHernández-López, Ana María, Juan Antonio Aguilar-Garib, Sophie Guillemet-Fritsch, Roman Nava-Quintero, Pascal Dufour, Christophe Tenailleau, Bernard Durand, and Zarel Valdez-Nava. 2018. "Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)" Materials 11, no. 10: 1900. https://doi.org/10.3390/ma11101900