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Open AccessArticle

Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)

1
Universidad Autónoma de Nuevo León, CICFIM, San Nicolás de los Garza, N.L., MX 66455, Mexico
2
CIRIMAT, Université de Toulouse, CNRS, INPT, UPS, 31062 Toulouse CEDEX 9, France
3
LAPLACE, Université de Toulouse, CNRS, INPT, UPS, 31062 Toulouse CEDEX 9, France
4
Universidad Autónoma de Nuevo León, FIME, San Nicolás de los Garza, N.L., MX 66455, Mexico
5
Kemet Charged (México), Antiguo camino al Mezquital 100, San Nicolás de los Garza, N.L., MX 66490, Mexico
*
Author to whom correspondence should be addressed.
Materials 2018, 11(10), 1900; https://doi.org/10.3390/ma11101900
Received: 19 September 2018 / Revised: 1 October 2018 / Accepted: 3 October 2018 / Published: 4 October 2018
(This article belongs to the Special Issue Electroceramic Materials)
Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 °C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V. View Full-Text
Keywords: MLCC reliability; HALT; Y-doped BaTiO3; accelerated aging; X7R; activation energy MLCC reliability; HALT; Y-doped BaTiO3; accelerated aging; X7R; activation energy
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Hernández-López, A.M.; Aguilar-Garib, J.A.; Guillemet-Fritsch, S.; Nava-Quintero, R.; Dufour, P.; Tenailleau, C.; Durand, B.; Valdez-Nava, Z. Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT). Materials 2018, 11, 1900.

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