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Materials 2017, 10(11), 1258; https://doi.org/10.3390/ma10111258

Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy

1
Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
2
School of Chemistry and Materials Engineering, Fuyang Normal University, Fuyang 236037, China
3
University of Chinese Academy of Sciences, Beijing 100039, China
4
State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
Kunyu Zhao and Huizhu Yu contributed equally to this work.
*
Author to whom correspondence should be addressed.
Received: 30 July 2017 / Revised: 24 October 2017 / Accepted: 28 October 2017 / Published: 1 November 2017
(This article belongs to the Special Issue Scanning Probe Microscopy of Ferroics)
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Abstract

In this work, we have studied the microstructures, nanodomains, polarization preservation behaviors, and electrical properties of BiFe0.95Mn0.05O3 (BFMO) multiferroic thin films, which have been epitaxially created on the substrates of SrRuO3, SrTiO3, and TiN-buffered (001)-oriented Si at different oxygen pressures via piezoresponse force microscopy and conductive atomic force microscopy. We found that the pure phase state, inhomogeneous piezoresponse force microscopy (PFM) response, low leakage current with unidirectional diode-like properties, and orientation-dependent polarization reversal properties were found in BFMO thin films deposited at low oxygen pressure. Meanwhile, these films under high oxygen pressures resulted in impurities in the secondary phase in BFMO films, which caused a greater leakage that hindered the polarization preservation capability. Thus, this shows the important impact of the oxygen pressure on modulating the physical effects of BFMO films. View Full-Text
Keywords: multiferroic BiFe0.95Mn0.05O3 film; PFM; conductive-AFM; domain structure multiferroic BiFe0.95Mn0.05O3 film; PFM; conductive-AFM; domain structure
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Zhao, K.; Yu, H.; Zou, J.; Zeng, H.; Li, G.; Li, X. Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy. Materials 2017, 10, 1258.

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