Bâzu, M.; Gălăţeanu, L.; Ilian, V.E.; Loicq, J.; Habraken, S.; Collette, J.-P.
Quantitative Accelerated Life Testing of MEMS Accelerometers. Sensors 2007, 7, 2846-2859.
https://doi.org/10.3390/s7112846
AMA Style
Bâzu M, Gălăţeanu L, Ilian VE, Loicq J, Habraken S, Collette J-P.
Quantitative Accelerated Life Testing of MEMS Accelerometers. Sensors. 2007; 7(11):2846-2859.
https://doi.org/10.3390/s7112846
Chicago/Turabian Style
Bâzu, Marius, Lucian Gălăţeanu, Virgil Emil Ilian, Jerome Loicq, Serge Habraken, and Jean-Paul Collette.
2007. "Quantitative Accelerated Life Testing of MEMS Accelerometers" Sensors 7, no. 11: 2846-2859.
https://doi.org/10.3390/s7112846
APA Style
Bâzu, M., Gălăţeanu, L., Ilian, V. E., Loicq, J., Habraken, S., & Collette, J.-P.
(2007). Quantitative Accelerated Life Testing of MEMS Accelerometers. Sensors, 7(11), 2846-2859.
https://doi.org/10.3390/s7112846