Sun, H.; Guo, S.; Pan, X.; Shen, Q.; Xu, Y.; Ma, J.; Qu, Z.
MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. Sensors 2025, 25, 7049.
https://doi.org/10.3390/s25227049
AMA Style
Sun H, Guo S, Pan X, Shen Q, Xu Y, Ma J, Qu Z.
MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. Sensors. 2025; 25(22):7049.
https://doi.org/10.3390/s25227049
Chicago/Turabian Style
Sun, Hongbin, Shijun Guo, Xin Pan, Qiuchen Shen, Yaqi Xu, Jianchuan Ma, and Zhanpeng Qu.
2025. "MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV" Sensors 25, no. 22: 7049.
https://doi.org/10.3390/s25227049
APA Style
Sun, H., Guo, S., Pan, X., Shen, Q., Xu, Y., Ma, J., & Qu, Z.
(2025). MCP-YOLO: A Pruned Edge-Aware Detection Framework for Real-Time Insulator Defect Inspection via UAV. Sensors, 25(22), 7049.
https://doi.org/10.3390/s25227049