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Journal: Sensors, 2025
Volume: 25
Number: 6623
Article:
Advanced Signal Analysis Model for Internal Defect Mapping in Bridge Decks Using Impact-Echo Field Testing
Authors:
by
Avishkar Lamsal, Biggyan Lamsal, Bum-Jun Kim, Suyun Paul Ham and Daeik Jang
Link:
https://www.mdpi.com/1424-8220/25/21/6623
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