Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry
Abstract
1. Introduction
2. Principle
2.1. Phase Measuring Deflectometry Principle
2.2. Phase Extraction with Parasitic Reflection
2.2.1. The Phase Error Model
2.2.2. Calculating Δx and x1
3. Experiments
3.1. Measurement of a 40 mm Thick Standard Planar Element
3.2. Measurement of a 19 mm Flat Glass
4. Discussion
4.1. Limitation
4.2. Range of Application
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
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Huang, S.; Liu, Y.; Yu, X. Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry. Sensors 2024, 24, 1239. https://doi.org/10.3390/s24041239
Huang S, Liu Y, Yu X. Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry. Sensors. 2024; 24(4):1239. https://doi.org/10.3390/s24041239
Chicago/Turabian StyleHuang, Siya, Yuankun Liu, and Xin Yu. 2024. "Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry" Sensors 24, no. 4: 1239. https://doi.org/10.3390/s24041239
APA StyleHuang, S., Liu, Y., & Yu, X. (2024). Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry. Sensors, 24(4), 1239. https://doi.org/10.3390/s24041239