Yan, H.; Si, X.; Liang, J.; Duan, J.; Shi, T.
Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism. Sensors 2024, 24, 8053.
https://doi.org/10.3390/s24248053
AMA Style
Yan H, Si X, Liang J, Duan J, Shi T.
Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism. Sensors. 2024; 24(24):8053.
https://doi.org/10.3390/s24248053
Chicago/Turabian Style
Yan, Hao, Xiangfeng Si, Jianqiang Liang, Jian Duan, and Tielin Shi.
2024. "Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism" Sensors 24, no. 24: 8053.
https://doi.org/10.3390/s24248053
APA Style
Yan, H., Si, X., Liang, J., Duan, J., & Shi, T.
(2024). Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism. Sensors, 24(24), 8053.
https://doi.org/10.3390/s24248053