Otani, A.; Ogawa, H.; Miyauchi, K.; Han, S.; Owada, H.; Takayanagi, I.; Okura, S.
An Area-Efficient up/down Double-Sampling Circuit for a LOFIC CMOS Image Sensor. Sensors 2023, 23, 4478.
https://doi.org/10.3390/s23094478
AMA Style
Otani A, Ogawa H, Miyauchi K, Han S, Owada H, Takayanagi I, Okura S.
An Area-Efficient up/down Double-Sampling Circuit for a LOFIC CMOS Image Sensor. Sensors. 2023; 23(9):4478.
https://doi.org/10.3390/s23094478
Chicago/Turabian Style
Otani, Ai, Hiroaki Ogawa, Ken Miyauchi, Sangman Han, Hideki Owada, Isao Takayanagi, and Shunsuke Okura.
2023. "An Area-Efficient up/down Double-Sampling Circuit for a LOFIC CMOS Image Sensor" Sensors 23, no. 9: 4478.
https://doi.org/10.3390/s23094478
APA Style
Otani, A., Ogawa, H., Miyauchi, K., Han, S., Owada, H., Takayanagi, I., & Okura, S.
(2023). An Area-Efficient up/down Double-Sampling Circuit for a LOFIC CMOS Image Sensor. Sensors, 23(9), 4478.
https://doi.org/10.3390/s23094478