Shi, Z.; Sang, M.; Huang, Y.; Xing, L.; Liu, T.
Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model. Sensors 2022, 22, 9400.
https://doi.org/10.3390/s22239400
AMA Style
Shi Z, Sang M, Huang Y, Xing L, Liu T.
Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model. Sensors. 2022; 22(23):9400.
https://doi.org/10.3390/s22239400
Chicago/Turabian Style
Shi, Zhenman, Mei Sang, Yaokang Huang, Lun Xing, and Tiegen Liu.
2022. "Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model" Sensors 22, no. 23: 9400.
https://doi.org/10.3390/s22239400
APA Style
Shi, Z., Sang, M., Huang, Y., Xing, L., & Liu, T.
(2022). Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model. Sensors, 22(23), 9400.
https://doi.org/10.3390/s22239400