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Journal: Sensors, 2020
Volume: 20
Number: 7356
7356
Article: X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors
Authors: by Jumpei Yamada, Takato Inoue, Nami Nakamura, Takashi Kameshima, Kazuto Yamauchi, Satoshi Matsuyama and Makina Yabashi
Link: https://www.mdpi.com/1424-8220/20/24/7356

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