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Journal: Sensors, 2020
Volume: 20
Number: 448
Article:
A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction
Authors:
by
Xue Chen, Jiaqi Li and Yongxin Sui
Link:
https://www.mdpi.com/1424-8220/20/2/448
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