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Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor

Center for Nanocharacterization, Korea Research Institute of Standards and Science, Daejeon 34113, Korea
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Sensors 2019, 19(7), 1530; https://doi.org/10.3390/s19071530
Received: 27 February 2019 / Revised: 26 March 2019 / Accepted: 27 March 2019 / Published: 29 March 2019
(This article belongs to the Special Issue Quartz Tuning Fork-based Sensors)
We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool. The bimodal atomic force microscopy technique combined with a sideband coupling scheme is exploited for the high-sensitivity imaging of the QTF-PiFM. We measured the photo-induced force images of nano-clusters of Silicon 2,3-naphthalocyanine bis dye and thin graphene film and found that the QTF-PiFM is capable of high-spatial-resolution nano-optical imaging with a good signal-to-noise ratio. Applying the QTF-PiFM to various experimental conditions will open new opportunities for the spectroscopic visualization and substructure characterization of a vast variety of nano-materials from semiconducting devices to polymer thin films to sensitive measurements of single molecules. View Full-Text
Keywords: photo-induced force microscopy (PiFM); quartz tuning fork; nano-optics photo-induced force microscopy (PiFM); quartz tuning fork; nano-optics
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Jahng, J.; Kwon, H.; Lee, E.S. Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor. Sensors 2019, 19, 1530.

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