Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope
AbstractWe introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity. View Full-Text
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An, S.; Jhe, W. Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope. Sensors 2019, 19, 1794.
An S, Jhe W. Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope. Sensors. 2019; 19(8):1794.Chicago/Turabian Style
An, Sangmin; Jhe, Wonho. 2019. "Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope." Sensors 19, no. 8: 1794.
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