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Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
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Sensors 2019, 19(8), 1794; https://doi.org/10.3390/s19081794

Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Department of Physics & Astronomy, Seoul National University, Seoul 08826, Korea
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Received: 25 February 2019 / Revised: 30 March 2019 / Accepted: 10 April 2019 / Published: 15 April 2019
(This article belongs to the Special Issue Quartz Tuning Fork-based Sensors)
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Abstract

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity. View Full-Text
Keywords: nanopipette; nanorod; QTF–AFM; nanolithography; nanoscratching nanopipette; nanorod; QTF–AFM; nanolithography; nanoscratching
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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An, S.; Jhe, W. Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope. Sensors 2019, 19, 1794.

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