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Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
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Sensors 2019, 19(8), 1794;

Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Department of Physics & Astronomy, Seoul National University, Seoul 08826, Korea
Authors to whom correspondence should be addressed.
Received: 25 February 2019 / Revised: 30 March 2019 / Accepted: 10 April 2019 / Published: 15 April 2019
(This article belongs to the Special Issue Quartz Tuning Fork-based Sensors)
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We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity. View Full-Text
Keywords: nanopipette; nanorod; QTF–AFM; nanolithography; nanoscratching nanopipette; nanorod; QTF–AFM; nanolithography; nanoscratching

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An, S.; Jhe, W. Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope. Sensors 2019, 19, 1794.

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