Simple Random Sampling-Based Probe Station Selection for Fault Detection in Wireless Sensor Networks
AbstractFault detection for wireless sensor networks (WSNs) has been studied intensively in recent years. Most existing works statically choose the manager nodes as probe stations and probe the network at a fixed frequency. This straightforward solution leads however to several deficiencies. Firstly, by only assigning the fault detection task to the manager node the whole network is out of balance, and this quickly overloads the already heavily burdened manager node, which in turn ultimately shortens the lifetime of the whole network. Secondly, probing with a fixed frequency often generates too much useless network traffic, which results in a waste of the limited network energy. Thirdly, the traditional algorithm for choosing a probing node is too complicated to be used in energy-critical wireless sensor networks. In this paper, we study the distribution characters of the fault nodes in wireless sensor networks, validate the Pareto principle that a small number of clusters contain most of the faults. We then present a Simple Random Sampling-based algorithm to dynamic choose sensor nodes as probe stations. A dynamic adjusting rule for probing frequency is also proposed to reduce the number of useless probing packets. The simulation experiments demonstrate that the algorithm and adjusting rule we present can effectively prolong the lifetime of a wireless sensor network without decreasing the fault detected rate. View Full-Text
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Huang, R.; Qiu, X.; Rui, L. Simple Random Sampling-Based Probe Station Selection for Fault Detection in Wireless Sensor Networks. Sensors 2011, 11, 3117-3134.
Huang R, Qiu X, Rui L. Simple Random Sampling-Based Probe Station Selection for Fault Detection in Wireless Sensor Networks. Sensors. 2011; 11(3):3117-3134.Chicago/Turabian Style
Huang, Rimao; Qiu, Xuesong; Rui, Lanlan. 2011. "Simple Random Sampling-Based Probe Station Selection for Fault Detection in Wireless Sensor Networks." Sensors 11, no. 3: 3117-3134.