Next Article in Journal
Chemerin and Cancer
Next Article in Special Issue
Reaction of Electrons with DNA: Radiation Damage to Radiosensitization
Previous Article in Journal
Dental Pulp Stem Cell-Derived Factors Alleviate Subarachnoid Hemorrhage-Induced Neuroinflammation and Ischemic Neurological Deficits
Previous Article in Special Issue
Reactions in the Radiosensitizer Misonidazole Induced by Low-Energy (0–10 eV) Electrons
Open AccessReview

Clustered DNA Damages induced by 0.5 to 30 eV Electrons

by 1,* and 2
State Key Laboratory of Photocatalysis on Energy and Environment, Fuzhou University, Fuzhou 350116, China
Département de Médecine Nucléaire et Radiobiologie et Centre de Recherche Clinique, Faculté de Médecine, Université de Sherbrooke, Sherbrooke, QC J1H 5N4, Canada
Author to whom correspondence should be addressed.
Int. J. Mol. Sci. 2019, 20(15), 3749;
Received: 15 July 2019 / Revised: 26 July 2019 / Accepted: 29 July 2019 / Published: 31 July 2019
(This article belongs to the Special Issue Radiation-Induced Damage to DNA)
Low-energy electrons (LEEs) of energies ≤30 eV are generated in large quantities by ionizing radiation. These electrons can damage DNA; particularly, they can induce the more detrimental clustered lesions in cells. This type of lesions, which are responsible for a large portion of the genotoxic stress generated by ionizing radiation, is described in the Introduction. The reactions initiated by the collisions of 0.5–30 eV electrons with oligonucleotides, duplex DNA, and DNA bound to chemotherapeutic platinum drugs are explained and reviewed in the subsequent sections. The experimental methods of LEE irradiation and DNA damage analysis are described with an emphasis on the detection of cluster lesions, which are considerably enhanced in DNA–Pt–drug complexes. Based on the energy dependence of damage yields and cross-sections, a mechanism responsible for the clustered lesions can be attributed to the capture of a single electron by the electron affinity of an excited state of a base, leading to the formation of transient anions at 6 and 10 eV. The initial capture is followed by electronic excitation of the base and dissociative attachment—at other DNA sites—of the electron reemitted from the temporary base anion. The mechanism is expected to be universal in the cellular environment and plays an important role in the formation of clustered lesions. View Full-Text
Keywords: clustered DNA damages; low-energy electrons; transient anions; base modifications clustered DNA damages; low-energy electrons; transient anions; base modifications
Show Figures

Graphical abstract

MDPI and ACS Style

Zheng, Y.; Sanche, L. Clustered DNA Damages induced by 0.5 to 30 eV Electrons. Int. J. Mol. Sci. 2019, 20, 3749.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map

Back to TopTop