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Keywords = confocal chromatic imaging

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15 pages, 4295 KiB  
Article
Long-Distance Measurements Using a Chromatic Confocal Sensor
by Kiril Ivanov Kurtev, Juan Manuel Trujillo-Sevilla and José Manuel Rodríguez-Ramos
Appl. Sci. 2024, 14(21), 9943; https://doi.org/10.3390/app14219943 - 30 Oct 2024
Viewed by 1897
Abstract
In this work, we demonstrate the use of a chromatic confocal sensor for long-distance measurements. The sensor increases the working distance of state-of-the-art confocal sensors by a factor of 10, reaching a working distance of 620 mm. The chromatic aberration exhibited by a [...] Read more.
In this work, we demonstrate the use of a chromatic confocal sensor for long-distance measurements. The sensor increases the working distance of state-of-the-art confocal sensors by a factor of 10, reaching a working distance of 620 mm. The chromatic aberration exhibited by a lens was utilized to establish the working range. The chromatic dispersion of the optics led to images of the different wavelength components at different longitudinal points along the optical axis. The sensor employs a robust algorithm to measure relative displacements of the sample’s motion. The calibration process simplifies data analysis and improves the accuracy of displacement measurements in experimental setups. To facilitate the design process, a simulator was developed specifically for this purpose. The calibration data obtained in both the experimental and the simulated data show that the simulator was able to predict the sensitivity with an error of 5%. We also describe the effect on the sensitivity of oversampling the spectrum. In addition, the superiority of low-pass filtering over Gaussian fitting over the detected spectrum is shown. Full article
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11 pages, 4909 KiB  
Communication
A Kernel-Based Calibration Algorithm for Chromatic Confocal Line Sensors
by Ming Qin, Xiao Xiong, Enqiao Xiao, Min Xia, Yimeng Gao, Hucheng Xie, Hui Luo and Wenhao Zhao
Sensors 2024, 24(20), 6649; https://doi.org/10.3390/s24206649 - 15 Oct 2024
Viewed by 1084
Abstract
In chromatic confocal line sensors, calibration is usually divided into peak extraction and wavelength calibration. In previous research, the focus was mainly on peak extraction. In this paper, a kernel-based algorithm is proposed to deal with wavelength calibration, which corresponds to the mapping [...] Read more.
In chromatic confocal line sensors, calibration is usually divided into peak extraction and wavelength calibration. In previous research, the focus was mainly on peak extraction. In this paper, a kernel-based algorithm is proposed to deal with wavelength calibration, which corresponds to the mapping relationship between peaks (i.e., the wavelengths) in image space and profiles in physical space. The primary component of the mapping function is depicted using polynomial basis functions, which are distinguished along various dispersion axes. Considering the unknown distortions resulting from field curvature, sensor fabrication and assembly, and even the inherent complexity of dispersion, a typical kernel trick-based nonparametric function element is introduced here, predicated on the notion that similar processes conducted on the same sensor yield comparable distortions.To ascertain the performance with and without the kernel trick, we carried out wavelength calibration and groove fitting on a standard groove sample processed via glass grinding and with a reference depth of 66.14 μm. The experimental results show that depths calculated by the kernel-based calibration algorithm have higher accuracy and lower uncertainty than those ascertained using the conventional polynomial algorithm. As such, this indicates that the proposed algorithm provides effective improvements. Full article
(This article belongs to the Section Optical Sensors)
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23 pages, 6709 KiB  
Review
High-Precision Chromatic Confocal Technologies: A Review
by Jingwen Li, Rui Ma and Jiao Bai
Micromachines 2024, 15(10), 1224; https://doi.org/10.3390/mi15101224 - 30 Sep 2024
Cited by 10 | Viewed by 3742
Abstract
Chromatic confocal technology is widely used for precise, steady, and efficient displacement measurement in many industrial fields. It employs the confocal and dispersion principles to encode axial positions with the wavelengths of the reflected broad spectrum. The typical chromatic confocal sensor includes a [...] Read more.
Chromatic confocal technology is widely used for precise, steady, and efficient displacement measurement in many industrial fields. It employs the confocal and dispersion principles to encode axial positions with the wavelengths of the reflected broad spectrum. The typical chromatic confocal sensor includes a light source, a dispersion objective, conjugate pinholes, and a spectral detection device. This study offers an overview of the current research on chromatic confocal technology. Because of its good performance in displacement detection, chromatic confocal technology has been widely used in contour measurement, biomedical imaging, and thickness measurements, as part of global and professional research. Due to its structural flexibility, it is also easily integrated into industrial equipment for in-machine and online profile measurements. It holds significant potential for future applications in industrial manufacturing and scientific research. However, there are also some challenges to be explored in terms of the broadband light source, dispersive optics design, and the balance between speed and accuracy in signal processing. Full article
(This article belongs to the Special Issue Feature Reviews in Micromachines 2024)
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18 pages, 1688 KiB  
Perspective
Optical Measurement of Ligament Strain: Opportunities and Limitations for Intraoperative Application
by Christian Marx, Paul Wulff, Christian Fink and Daniel Baumgarten
Sensors 2023, 23(17), 7487; https://doi.org/10.3390/s23177487 - 28 Aug 2023
Cited by 1 | Viewed by 1837
Abstract
A feasible and precise method to measure ligament strain during surgical interventions could significantly enhance the quality of ligament reconstructions. However, all existing scientific approaches to measure in vivo ligament strain possess at least one significant disadvantage, such as the impairment of the [...] Read more.
A feasible and precise method to measure ligament strain during surgical interventions could significantly enhance the quality of ligament reconstructions. However, all existing scientific approaches to measure in vivo ligament strain possess at least one significant disadvantage, such as the impairment of the anatomical structure. Seeking a more advantageous method, this paper proposes defining medical and technical requirements for a non-destructive, optical measurement technique. Furthermore, we offer a comprehensive review of current optical endoscopic techniques which could potentially be suitable for in vivo ligament strain measurement, along with the most suitable optical measurement techniques. The most promising options are rated based on the defined explicit and implicit requirements. Three methods were identified as promising candidates for a precise optical measurement of the alteration of a ligaments strain: confocal chromatic imaging, shearography, and digital image correlation. Full article
(This article belongs to the Special Issue Optical and Acoustical Methods for Biomedical Imaging and Sensing)
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17 pages, 6144 KiB  
Article
Online Correction of Laser Head Nozzle Position for Laser Metal Deposition Using a Chromatic Confocal Displacement System
by Piotr Koruba, Grzegorz Iskierka, Bartosz Poskart, Jakub Mazur and Adrian Zakrzewski
Sensors 2023, 23(16), 7120; https://doi.org/10.3390/s23167120 - 11 Aug 2023
Cited by 1 | Viewed by 1613
Abstract
The stability and repeatability of laser metal deposition is particularly important when processing multiple layers or depositing material on complex component surfaces, and requires the use of process parameter control including the stand-off distance between the laser head and the substrate. The system [...] Read more.
The stability and repeatability of laser metal deposition is particularly important when processing multiple layers or depositing material on complex component surfaces, and requires the use of process parameter control including the stand-off distance between the laser head and the substrate. The system proposed in this paper for correcting the stand-off parameter is based on a chromatic confocal sensor integrated into a laser head. Then, the spectral signal acquired from the measurement system is processed by using the developed application to compensate for the movement of an additional axis of the kinematic system. This study used an independent verification system based on the digital image correlation method. The validation tests were carried out using the system for correcting the stand-off parameter with different control algorithms and given motion trajectories and substrate materials. The results demonstrate that the developed system can be useful for laser metal deposition. Full article
(This article belongs to the Special Issue Optical Sensors for Industry Applications)
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14 pages, 4746 KiB  
Article
Wafer Eccentricity Deviation Measurement Method Based on Line-Scanning Chromatic Confocal 3D Profiler
by Dingjun Qu, Zuoda Zhou, Zhiwei Li, Ruizhe Ding, Wei Jin, Haiyan Luo and Wei Xiong
Photonics 2023, 10(4), 398; https://doi.org/10.3390/photonics10040398 - 3 Apr 2023
Cited by 6 | Viewed by 3979
Abstract
The wafer eccentricity deviation caused by misalignment between the center of the wafer and rotary table will lead to edge image distortion and quality degradation of the defect signals during automated inspection. However, wafer end jump and edge topography change will bring great [...] Read more.
The wafer eccentricity deviation caused by misalignment between the center of the wafer and rotary table will lead to edge image distortion and quality degradation of the defect signals during automated inspection. However, wafer end jump and edge topography change will bring great challenges to the accurate measurement of micrometer deviations. A new wafer eccentricity deviation measurement method based on line-scanning chromatic confocal sensors (LSCCSs) is proposed. Firstly, the LSCCS with Z-axis submicron resolution used in the experiment acquires the 3D profile height of the wafer edge as the turntable rotates, and the edge distance is calculated at each rotation angle. Secondly, a robust Fourier-LAR fitting method is used to fit edge distance serial to reduce sensitivity to outliers. Finally, the wafer eccentricity deviation that is equal to the wafer center coordinate can be calculated using the wafer eccentricity deviation model. In the simulated experiment, the results show that the eccentricity deviation measurement accuracy was insensitivity to noise and reached the micron level. Additionally, the measurement uncertainty of eccentricity deviation coordinate Xw,Yw was (0.53 µm, 1.4 µm) in the actual data of the 12-inch wafers. Full article
(This article belongs to the Special Issue Recent Advances in Optical Metrology)
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16 pages, 5056 KiB  
Article
Micron-Scale Biogeography of Seawater Biofilm Colonies at Submersed Solid Substrata Affected by Organic Matter and Microbiome Transformation in the Baltic Sea
by Maciej Grzegorczyk, Stanislaw Pogorzelski, Paulina Janowicz, Katarzyna Boniewicz-Szmyt and Pawel Rochowski
Materials 2022, 15(18), 6351; https://doi.org/10.3390/ma15186351 - 13 Sep 2022
Viewed by 1631
Abstract
The aim of this research was to determine temporal and spatial evolution of biofilm architecture formed at model solid substrata submersed in Baltic sea coastal waters in relation to organic matter transformation along a one-year period. Several materials (metals, glass, plastics) were deployed [...] Read more.
The aim of this research was to determine temporal and spatial evolution of biofilm architecture formed at model solid substrata submersed in Baltic sea coastal waters in relation to organic matter transformation along a one-year period. Several materials (metals, glass, plastics) were deployed for a certain time, and the collected biofilm-covered samples were studied with a confocal microscopy technique using the advanced programs of image analysis. The geometric and structural biofilm characteristics: biovolume, coverage fraction, mean thickness, spatial heterogeneity, roughness, aggregation coefficient, etc., turned out to evolve in relation to organic matter transformation trends, trophic water status, microbiome evolution, and biofilm micro-colony transition from the heterotrophic community (mostly bacteria) to autotrophic (diatom-dominated) systems. The biofilm morphology parameters allowed the substratum roughness, surface wettability, chromatic organisms colony adaptation to substrata, and quorum sensing or cell to cell signaling effects to be quantitatively evaluated. In addition to the previous work, the structural biofilm parameters could become further novel trophic state indicators. Full article
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20 pages, 5289 KiB  
Article
Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination
by Qing Yu, Chong Wang, Yali Zhang, Shengming Hu, Ting Liu, Fang Cheng, Yin Wang, Tianliang Lin and Lin Xi
Photonics 2022, 9(3), 155; https://doi.org/10.3390/photonics9030155 - 4 Mar 2022
Cited by 8 | Viewed by 3419
Abstract
As a fast, high-accuracy and non-contact method, chromatic confocal microscopy is widely used in micro dimensional measurement. In this area, thickness measurement for transparent specimen is one of the typical applications. In conventional coaxial illumination mode, both the illumination and imaging axes are [...] Read more.
As a fast, high-accuracy and non-contact method, chromatic confocal microscopy is widely used in micro dimensional measurement. In this area, thickness measurement for transparent specimen is one of the typical applications. In conventional coaxial illumination mode, both the illumination and imaging axes are perpendicular to the test specimen. At the same time, there are also geometric measurement limitations in conventional mode. When measuring high-transparency specimen, the energy efficiency will be quite low, and the reflection will be very weak. This limitation will significantly affect the signal-to-noise ratio. The inclined illumination mode is a good solution to overcome this bottleneck, but the thickness results may vary at different axial positions of the sample. In this paper, an error correction method for thickness measurement of transparent samples is proposed. In the authors’ work, the error correction model was analyzed and simulated, and the influence caused by the different axial positions of sample could be theoretically eliminated. The experimental results showed that the thickness measurement of the samples was practically usable, and the measurement errors were significantly reduced by less than 2.12%, as compared to the uncorrected system. With this error correction model, the standard deviation had decreased significantly, and the axial measurement accuracy of the system can reach the micron level. Additionally, this model has the same correction effect on the samples with different refractive indexes. Therefore, the system can realize the requirement of measurement at different axial positions. Full article
(This article belongs to the Special Issue Glass Optics)
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16 pages, 3178 KiB  
Article
Thickness Measurement for Glass Slides Based on Chromatic Confocal Microscopy with Inclined Illumination
by Qing Yu, Yali Zhang, Wenjian Shang, Shengchao Dong, Chong Wang, Yin Wang, Ting Liu and Fang Cheng
Photonics 2021, 8(5), 170; https://doi.org/10.3390/photonics8050170 - 20 May 2021
Cited by 26 | Viewed by 5469
Abstract
Chromatic confocal microscopy is a widely used method to measure the thickness of transparent specimens. In conventional configurations, both the illumination and imaging axes are perpendicular to the test specimen. The reflection will be very weak when measuring high-transparency specimens. In order to [...] Read more.
Chromatic confocal microscopy is a widely used method to measure the thickness of transparent specimens. In conventional configurations, both the illumination and imaging axes are perpendicular to the test specimen. The reflection will be very weak when measuring high-transparency specimens. In order to overcome this limitation, a special chromatic confocal measuring system was developed based on inclined illumination. This design was able to significantly improve the signal-to-noise ratio. Compared with conventional designs, the proposed system was also featured by its biaxial optical scheme, instead of a coaxial one. This biaxial design improved the flexibility of the system and also increased the energy efficiency by avoiding light beam splitting. Based on this design, a prototype was built by the authors’ team. In this paper, the theoretical model of this specially designed chromatic confocal system is analyzed, and the calculating formula for the thickness of transparent specimen is provided accordingly. In order to verify its measurement performance, two experimental methodology and results are presented. The experimental results show that the repeatability is better than 0.54 μm, and the axial measurement accuracy of the system could reach the micron level. Full article
(This article belongs to the Special Issue Glass Optics)
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9 pages, 2420 KiB  
Letter
Swept-Source-Based Chromatic Confocal Microscopy
by Dawoon Jeong, Se Jin Park, Hansol Jang, Hyunjoo Kim, Jaesun Kim and Chang-Seok Kim
Sensors 2020, 20(24), 7347; https://doi.org/10.3390/s20247347 - 21 Dec 2020
Cited by 9 | Viewed by 6145
Abstract
Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the [...] Read more.
Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the novel concept of swept-source-based CCM (SS-CCM) and investigated the usefulness of the corresponding imaging system. Compared to conventional CCM based on a broadband light source and a spectrometer, a swept-source in the proposed SS-CCM generates light with a narrower linewidth for higher intensity, and a single photodetector employed in the system exhibits a fast and sensitive response by immediately obtaining spectrally encoded depth from a chromatic dispersive lens array. Results of the experiments conducted to test the proposed SS-CCM system indicate that the system exhibits an axial chromatic focal distance range of approximately 360 μm for the 770–820 nm swept wavelength range. Moreover, high-speed surface profiling images of a cover glass and coin were successfully obtained with a short measurement time of 5 ms at a single position. Full article
(This article belongs to the Special Issue Sensing, Computing and Imaging in 3D Microscopy)
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14 pages, 682 KiB  
Article
Volumetrical Characterization of Sheet Molding Compounds
by Alfredo Calvimontes, Karina Grundke and Anett Müller
Materials 2010, 3(12), 5083-5096; https://doi.org/10.3390/ma3125083 - 1 Dec 2010
Cited by 3 | Viewed by 7725
Abstract
For a comprehensive study of Sheet Molding Compound (SMC) surfaces, topographical data obtained by chromatic confocal imaging were submitted systematically for the development of a profile model to understand the formation of cavities on the surface. In order to qualify SMC surfaces and [...] Read more.
For a comprehensive study of Sheet Molding Compound (SMC) surfaces, topographical data obtained by chromatic confocal imaging were submitted systematically for the development of a profile model to understand the formation of cavities on the surface. In order to qualify SMC surfaces and to predict their coatability, a characterization of cavities is applied. To quantify the effect of surface modification treatments, a new parameter (Surface Relative Smooth) is presented, applied and probed. The parameter proposed can be used for any surface modification of any solid material. Full article
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20 pages, 1460 KiB  
Article
Advances for the Topographic Characterisation of SMC Materials
by Alfredo Calvimontes, Karina Grundke, Anett Müller and Manfred Stamm
Materials 2009, 2(3), 1084-1103; https://doi.org/10.3390/ma2031084 - 27 Aug 2009
Cited by 7 | Viewed by 14963
Abstract
For a comprehensive study of Sheet Moulding Compound (SMC) surfaces, topographical data obtained by a contact-free optical method (chromatic aberration confocal imaging) were systematically acquired to characterise these surfaces with regard to their statistical, functional and volumetrical properties. Optimal sampling conditions (cut-off length [...] Read more.
For a comprehensive study of Sheet Moulding Compound (SMC) surfaces, topographical data obtained by a contact-free optical method (chromatic aberration confocal imaging) were systematically acquired to characterise these surfaces with regard to their statistical, functional and volumetrical properties. Optimal sampling conditions (cut-off length and resolution) were obtained by a topographical-statistical procedure proposed in the present work. By using different length scales specific morphologies due to the influence of moulding conditions, metallic mould topography, glass fibre content and glass fibre orientation can be characterized. The aim of this study is to suggest a systematic topographical characterization procedure for composite materials in order to study and recognize the influence of production conditions on their surface quality. Full article
(This article belongs to the Special Issue Composite Materials)
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