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Keywords = X-ray free electron laser (XFEL)

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12 pages, 1371 KiB  
Article
Multi-Beam-Energy Control Unit Based on Triple-Bend Achromats
by Liuyang Wu, Zihan Zhu, Bingyang Yan, Jiawei Yan and Haixiao Deng
Photonics 2025, 12(3), 275; https://doi.org/10.3390/photonics12030275 - 17 Mar 2025
Viewed by 479
Abstract
X-ray free electron lasers (XFELs) are the new generation of particle accelerator-based light sources, capable of producing tunable, high-power X-ray pulses that are increasingly vital across various scientific disciplines. Recently, continuous-wave (CW) XFELs driven by superconducting linear accelerators have garnered significant attention due [...] Read more.
X-ray free electron lasers (XFELs) are the new generation of particle accelerator-based light sources, capable of producing tunable, high-power X-ray pulses that are increasingly vital across various scientific disciplines. Recently, continuous-wave (CW) XFELs driven by superconducting linear accelerators have garnered significant attention due to their ability to enhance availability by supporting multiple undulator lines simultaneously. In this paper, we introduce a novel delay system comprising four triple-bend achromats (TBAs). This delay system was combined with fast kickers and can be employed to generate electron beams on a bunch-to-bunch basis in a CW-XFEL facility. Based on the parameters of the Shanghai High-Repetition-Rate XFEL and Extreme Light Facility, start-to-end simulations demonstrate that the TBA-based delay system achieves excellent electron beam qualities while providing a wide beam-energy-tuning range from 1.39 to 8 GeV. Full article
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15 pages, 3569 KiB  
Review
Application of Fixed-Target Microcrystal Delivery Systems for Serial Femtosecond Crystallography at PAL-XFEL
by Jaehyun Park and Ki Hyun Nam
Analytica 2025, 6(1), 7; https://doi.org/10.3390/analytica6010007 - 27 Feb 2025
Viewed by 1353
Abstract
Serial femtosecond crystallography (SFX) using X-ray free-electron lasers (XFELs) enables the determination of biological and chemical structures without radiation damage. In SFX experiments, a sample delivery system is essential for delivering numerous crystals to the X-ray interaction point in a serial and stable [...] Read more.
Serial femtosecond crystallography (SFX) using X-ray free-electron lasers (XFELs) enables the determination of biological and chemical structures without radiation damage. In SFX experiments, a sample delivery system is essential for delivering numerous crystals to the X-ray interaction point in a serial and stable manner. Among the various sample delivery methods, the fixed-target (FT) sample delivery system is straightforward and widely used for collecting SFX data due to its advantages of low sample consumption and reduced physical damage to crystals during data collection. Here, we review the development of the FT sample delivery system for SFX with the Pohang Accelerator Laboratory X-ray free-electron laser (PAL-XFEL). The specifications and operational conditions of the FT-SFX sample chamber are described. The design, specifications, and applications of the one- and two-dimensional FT sample holders developed for SFX with the PAL-XFEL are also detailed. Furthermore, the applications of each FT sample delivery system are discussed. This review not only provides valuable information on the FT system used in SFX experiments with the PAL-XFEL but also offers insights into the development of FT sample delivery systems. Full article
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13 pages, 8030 KiB  
Article
A System Control and Waveform Acquisition Framework for the Kicker System at SHINE
by Sheying Li, Yongfang Liu and Qibing Yuan
Electronics 2025, 14(2), 315; https://doi.org/10.3390/electronics14020315 - 15 Jan 2025
Viewed by 744
Abstract
A lumped kicker magnet system is being developed as part of the electron beam switchyard of the Shanghai High Repetition Rate X-Ray Free-Electron Laser (XFEL) and Extreme Light (SHINE) facility at Shanghai Advanced Research Institute (SARI), Chinese Academy of Sciences (CAS). SHINE is [...] Read more.
A lumped kicker magnet system is being developed as part of the electron beam switchyard of the Shanghai High Repetition Rate X-Ray Free-Electron Laser (XFEL) and Extreme Light (SHINE) facility at Shanghai Advanced Research Institute (SARI), Chinese Academy of Sciences (CAS). SHINE is a linac-based facility with an energy of 8 GeV and a repetition rate of 1 MHz for multiple users. The kicker system is a critical element of the deflection system and determines the stability performance of the beamlines. To ensure autonomous and reliable operation in a harsh environment, a dedicated control system—consisting of a custom-designed programmable logic controller (PLC) and waveform acquisition system—has been developed based on the Experimental Physics and Industrial Control System (EPICS). The PLCsystem enables status acquisition, control implantations, and alarm handling, allowing for automated operation. The waveform acquisition system provides an intuitive demonstration and enables the real-time diagnosis of kicker waveforms. The results demonstrate a half quasi-sinuous waveform with a peak current of 11.5 A and a full width at half maximum of 218 ns at a repetition rate of 10 kHz. The detailed design, overall concept, achieved performance, and initial test results of two modular controls are provided for further demonstration. Full article
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10 pages, 627 KiB  
Article
Structural Insights into Phycocyanin Langmuir–Blodgett Multilayers via Serial Femtosecond Crystallography with X-ray Free-Electron Laser
by Eugenia Pechkova, Fabio Massimo Speranza, Paola Ghisellini, Stefano Fiordoro, Cristina Rando and Roberto Eggenhöffner
Crystals 2024, 14(9), 767; https://doi.org/10.3390/cryst14090767 - 29 Aug 2024
Viewed by 1309
Abstract
Serial femtosecond crystallography (SFX) with X-ray free-electron lasers (XFELs) has revolutionized classical X-ray diffraction experiments by utilizing ultra-short, intense, and coherent X-ray pulses. However, the SFX approach still requires thousands of nearly identical samples, leading to significant protein consumption. We propose utilizing Langmuir–Blodgett [...] Read more.
Serial femtosecond crystallography (SFX) with X-ray free-electron lasers (XFELs) has revolutionized classical X-ray diffraction experiments by utilizing ultra-short, intense, and coherent X-ray pulses. However, the SFX approach still requires thousands of nearly identical samples, leading to significant protein consumption. We propose utilizing Langmuir–Blodgett protein multilayers, which are characterized by long-range order, thermal stability, and the ability to induce protein crystallization, even in proteins that cannot be crystallized by conventional methods. This study aimed to combine the intrinsic properties of Langmuir–Blodgett multilayers with advanced XFEL techniques at the Linac Coherent Light Source. Since the macromolecule organization can be explored in nano or 2D crystals exploiting the properties of SFX–XFEL radiation that enable the capture of high-resolution diffraction images before radiation damage occurs, we propose Langmuir–Blodgett protein nanofilm technology as a novel approach for direct “on-chip” protein sample preparation. The present study extends previous investigations into Langmuir–Blodgett phycocyanin multilayer nanofilms using synchrotron radiation cryo-EM microscopy and second-order nonlinear imaging of chiral crystal (SONICC) experiments. We also examined the thermal stability of phycocyanin Langmuir–Blodgett multilayered films deposited on Si3N4 membranes to evaluate structural changes occurring at 150 °C compared with room temperature. Phycocyanin Langmuir–Blodgett films are worthy of investigation in view of their suitability for tissue engineering and other applications due to their thermal integrity and stability as the results of the present investigation reveal. Full article
(This article belongs to the Special Issue X-Ray Protein Crystallography)
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28 pages, 7926 KiB  
Review
Innovative Strategies in X-ray Crystallography for Exploring Structural Dynamics and Reaction Mechanisms in Metabolic Disorders
by Alice Grieco, Isabel Quereda-Moraleda and Jose Manuel Martin-Garcia
J. Pers. Med. 2024, 14(9), 909; https://doi.org/10.3390/jpm14090909 - 27 Aug 2024
Viewed by 2220
Abstract
Enzymes are crucial in metabolic processes, and their dysfunction can lead to severe metabolic disorders. Structural biology, particularly X-ray crystallography, has advanced our understanding of these diseases by providing 3D structures of pathological enzymes. However, traditional X-ray crystallography faces limitations, such as difficulties [...] Read more.
Enzymes are crucial in metabolic processes, and their dysfunction can lead to severe metabolic disorders. Structural biology, particularly X-ray crystallography, has advanced our understanding of these diseases by providing 3D structures of pathological enzymes. However, traditional X-ray crystallography faces limitations, such as difficulties in obtaining suitable protein crystals and studying protein dynamics. X-ray free-electron lasers (XFELs) have revolutionized this field with their bright and brief X-ray pulses, providing high-resolution structures of radiation-sensitive and hard-to-crystallize proteins. XFELs also enable the study of protein dynamics through room temperature structures and time-resolved serial femtosecond crystallography, offering comprehensive insights into the molecular mechanisms of metabolic diseases. Understanding these dynamics is vital for developing effective therapies. This review highlights the contributions of protein dynamics studies using XFELs and synchrotrons to metabolic disorder research and their application in designing better therapies. It also discusses G protein-coupled receptors (GPCRs), which, though not enzymes, play key roles in regulating physiological systems and are implicated in many metabolic disorders. Full article
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10 pages, 2340 KiB  
Article
Design of Machine Learning-Based Algorithms for Virtualized Diagnostic on SPARC_LAB Accelerator
by Giulia Latini, Enrica Chiadroni, Andrea Mostacci, Valentina Martinelli, Beatrice Serenellini, Gilles Jacopo Silvi and Stefano Pioli
Photonics 2024, 11(6), 516; https://doi.org/10.3390/photonics11060516 - 28 May 2024
Viewed by 1157
Abstract
Machine learning deals with creating algorithms capable of learning from the provided data. These systems have a wide range of applications and can also be a valuable tool for scientific research, which in recent years has been focused on finding new diagnostic techniques [...] Read more.
Machine learning deals with creating algorithms capable of learning from the provided data. These systems have a wide range of applications and can also be a valuable tool for scientific research, which in recent years has been focused on finding new diagnostic techniques for particle accelerator beams. In this context, SPARC_LAB is a facility located at the Frascati National Laboratories of INFN, where the progress of beam diagnostics is one of the main developments of the entire project. With this in mind, we aim to present the design of two neural networks aimed at predicting the spot size of the electron beam of the plasma-based accelerator at SPARC_LAB, which powers an undulator for the generation of an X-ray free electron laser (XFEL). Data-driven algorithms use two different data preprocessing techniques, namely an autoencoder neural network and PCA. With both approaches, the predicted measurements can be obtained with an acceptable margin of error and most importantly without activating the accelerator, thus saving time, even compared to a simulator that can produce the same result but much more slowly. The goal is to lay the groundwork for creating a digital twin of linac and conducting virtualized diagnostics using an innovative approach. Full article
(This article belongs to the Special Issue Recent Advances in Free Electron Laser Accelerators)
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20 pages, 2719 KiB  
Article
The Liquid Jet Endstation for Hard X-ray Scattering and Spectroscopy at the Linac Coherent Light Source
by Cali Antolini, Victor Sosa Alfaro, Marco Reinhard, Gourab Chatterjee, Ryan Ribson, Dimosthenis Sokaras, Leland Gee, Takahiro Sato, Patrick L. Kramer, Sumana Laxmi Raj, Brandon Hayes, Pamela Schleissner, Angel T. Garcia-Esparza, Jinkyu Lim, Jeffrey T. Babicz, Alec H. Follmer, Silke Nelson, Matthieu Chollet, Roberto Alonso-Mori and Tim B. van Driel
Molecules 2024, 29(10), 2323; https://doi.org/10.3390/molecules29102323 - 15 May 2024
Cited by 4 | Viewed by 2402
Abstract
The ability to study chemical dynamics on ultrafast timescales has greatly advanced with the introduction of X-ray free electron lasers (XFELs) providing short pulses of intense X-rays tailored to probe atomic structure and electronic configuration. Fully exploiting the full potential of XFELs requires [...] Read more.
The ability to study chemical dynamics on ultrafast timescales has greatly advanced with the introduction of X-ray free electron lasers (XFELs) providing short pulses of intense X-rays tailored to probe atomic structure and electronic configuration. Fully exploiting the full potential of XFELs requires specialized experimental endstations along with the development of techniques and methods to successfully carry out experiments. The liquid jet endstation (LJE) at the Linac Coherent Light Source (LCLS) has been developed to study photochemistry and biochemistry in solution systems using a combination of X-ray solution scattering (XSS), X-ray absorption spectroscopy (XAS), and X-ray emission spectroscopy (XES). The pump–probe setup utilizes an optical laser to excite the sample, which is subsequently probed by a hard X-ray pulse to resolve structural and electronic dynamics at their intrinsic femtosecond timescales. The LJE ensures reliable sample delivery to the X-ray interaction point via various liquid jets, enabling rapid replenishment of thin samples with millimolar concentrations and low sample volumes at the 120 Hz repetition rate of the LCLS beam. This paper provides a detailed description of the LJE design and of the techniques it enables, with an emphasis on the diagnostics required for real-time monitoring of the liquid jet and on the spatiotemporal overlap methods used to optimize the signal. Additionally, various scientific examples are discussed, highlighting the versatility of the LJE. Full article
(This article belongs to the Special Issue Photochemical Studies of Metal Complexes)
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32 pages, 23973 KiB  
Article
A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs
by James B. Rosenzweig, Gerard Andonian, Ronald Agustsson, Petr M. Anisimov, Aurora Araujo, Fabio Bosco, Martina Carillo, Enrica Chiadroni, Luca Giannessi, Zhirong Huang, Atsushi Fukasawa, Dongsung Kim, Sergey Kutsaev, Gerard Lawler, Zenghai Li, Nathan Majernik, Pratik Manwani, Jared Maxson, Janwei Miao, Mauro Migliorati, Andrea Mostacci, Pietro Musumeci, Alex Murokh, Emilio Nanni, Sean O’Tool, Luigi Palumbo, River Robles, Yusuke Sakai, Evgenya I. Simakov, Madison Singleton, Bruno Spataro, Jingyi Tang, Sami Tantawi, Oliver Williams, Haoran Xu and Monika Yadavadd Show full author list remove Hide full author list
Instruments 2024, 8(1), 19; https://doi.org/10.3390/instruments8010019 - 1 Mar 2024
Cited by 2 | Viewed by 4247
Abstract
Recently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and state-of-the-art concepts in beam dynamics, magnetic undulators, and X-ray optics. [...] Read more.
Recently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and state-of-the-art concepts in beam dynamics, magnetic undulators, and X-ray optics. A full conceptual design of a 1 nm (1.24 keV) UCXFEL with a length and cost over an order of magnitude below current X-ray free-electron lasers (XFELs) has resulted from this effort. This instrument has been developed with an emphasis on permitting exploratory scientific research in a wide variety of fields in a university setting. Concurrently, compact FELs are being vigorously developed for use as instruments to enable next-generation chip manufacturing through use as a high-flux, few nm lithography source. This new role suggests consideration of XFELs to urgently address emerging demands in the semiconductor device sector, as identified by recent national need studies, for new radiation sources aimed at chip manufacturing. Indeed, it has been shown that one may use coherent X-rays to perform 10–20 nm class resolution surveys of macroscopic, cm scale structures such as chips, using ptychographic laminography techniques. As the XFEL is a very promising candidate for realizing such methods, we present here an analysis of the issues and likely solutions associated with extending the UCXFEL to harder X-rays (above 7 keV), much higher fluxes, and increased levels of coherence, as well as methods of applying such a source for ptychographic laminography to microelectronic device measurements. We discuss the development path to move the concept to rapid realization of a transformative XFEL-based application, outlining both FEL and metrology system challenges. Full article
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16 pages, 12097 KiB  
Article
FPGA-Based Implementation of an Adaptive Noise Controller for Continuous Wave Superconducting Cavity
by Fatemeh Abdi, Wojciech Cichalewski, Wojciech Jałmużna, Łukasz Butkowski, Julien Branlard, Andrea Bellandi and Grzegorz Jabłoński
Electronics 2024, 13(1), 155; https://doi.org/10.3390/electronics13010155 - 29 Dec 2023
Viewed by 1605
Abstract
Low-level radio frequency (LLRF) systems have been designed to regulate the accelerator field in the cavity; these systems have been used in the free electron laser (FLASH) and European X-ray free-electron laser (E-XFEL). However, the reliable operation of these cavities is often hindered [...] Read more.
Low-level radio frequency (LLRF) systems have been designed to regulate the accelerator field in the cavity; these systems have been used in the free electron laser (FLASH) and European X-ray free-electron laser (E-XFEL). However, the reliable operation of these cavities is often hindered by two primary sources of noise and disturbances: Lorentz force detuning (LFD) and mechanical vibrations, commonly known as microphonics. This article presents an innovative solution in the form of a narrowband active noise controller (NANC) designed to compensate for the narrowband mechanical noise generated by certain supporting machines, such as vacuum pumps and helium pressure vibrations. To identify the adaptive filter coefficients in the NANC method, a least mean squares (LMS) algorithm is put forward. Furthermore, a variable step size (VSS) method is proposed to estimate the adaptive filter coefficients based on changes in microphonics, ultimately compensating for their effects on the cryomodule. An accelerometer with an SPI interface and some transmission boards are manufactured and mounted at the cryomodule test bench (CMTB) to measure the microphonics and transfer them via Ethernet cable from the cryomodule side to the LLRF crate side. Several locations had been selected to find the optimal location for installing the accelerometer. The proposed NANC method is characterized by low computational complexity, stability, and high tracking ability. By addressing the challenges associated with noise and disturbances in cavity operation, this research contributes to the enhanced performance and reliability of LLRF systems in particle accelerators. Full article
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17 pages, 826 KiB  
Article
Growing Crystals for X-ray Free-Electron Laser Structural Studies of Biomolecules and Their Complexes
by Christo N. Nanev, Emmanuel Saridakis and Naomi E. Chayen
Int. J. Mol. Sci. 2023, 24(22), 16336; https://doi.org/10.3390/ijms242216336 - 15 Nov 2023
Cited by 3 | Viewed by 1445
Abstract
Currently, X-ray crystallography, which typically uses synchrotron sources, remains the dominant method for structural determination of proteins and other biomolecules. However, small protein crystals do not provide sufficiently high-resolution diffraction patterns and suffer radiation damage; therefore, conventional X-ray crystallography needs larger protein crystals. [...] Read more.
Currently, X-ray crystallography, which typically uses synchrotron sources, remains the dominant method for structural determination of proteins and other biomolecules. However, small protein crystals do not provide sufficiently high-resolution diffraction patterns and suffer radiation damage; therefore, conventional X-ray crystallography needs larger protein crystals. The burgeoning method of serial crystallography using X-ray free-electron lasers (XFELs) avoids these challenges: it affords excellent structural data from weakly diffracting objects, including tiny crystals. An XFEL is implemented by irradiating microjets of suspensions of microcrystals with very intense X-ray beams. However, while the method for creating microcrystalline microjets is well established, little attention is given to the growth of high-quality nano/microcrystals suitable for XFEL experiments. In this study, in order to assist the growth of such crystals, we calculate the mean crystal size and the time needed to grow crystals to the desired size in batch crystallization (the predominant method for preparing the required microcrystalline slurries); this time is reckoned theoretically both for microcrystals and for crystals larger than the upper limit of the Gibbs–Thomson effect. The impact of the omnipresent impurities on the growth of microcrystals is also considered quantitatively. Experiments, performed with the model protein lysozyme, support the theoretical predictions. Full article
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17 pages, 1714 KiB  
Article
Shaping Micro-Bunched Electron Beams for Compact X-ray Free-Electron Lasers with Transverse Gradient Undulators
by River R. Robles and James B. Rosenzweig
Instruments 2023, 7(4), 35; https://doi.org/10.3390/instruments7040035 - 26 Oct 2023
Viewed by 2221
Abstract
Laser-modulator-based micro-bunching of electron beams has been applied to many novel operating modes of X-ray free-electron lasers from harmonic generation to attosecond pulse production. Recently, it was also identified as a key enabling technology for the production of a compact XFEL driven by [...] Read more.
Laser-modulator-based micro-bunching of electron beams has been applied to many novel operating modes of X-ray free-electron lasers from harmonic generation to attosecond pulse production. Recently, it was also identified as a key enabling technology for the production of a compact XFEL driven by a relatively low-energy beam. In traditional laser modulator schemes with low-energy and high-current bunches, collective effects limit the possible working points that can be employed, and thus it is difficult to achieve optimal XFEL performance. We propose to utilize transverse longitudinal coupling in a transverse gradient undulator (TGU) to shape micro-bunched electron beams so as to optimize their performance in a compact X-ray free-electron laser. We show that a TGU added to a conventional laser modulator stage enables much more flexibility in the design, allowing one to generate longer micro-bunches less subject to slippage effects and even lower the slice emittance of the micro-bunches. We present a theoretical analysis of laser-based micro-bunching with an added TGU, simulation of compression with collective effects in such systems, and finally XFEL simulations demonstrating the gains in peak power enabled by the TGU. Although we focus on the application to compact XFELs, what we propose is a general phase space manipulation that may find utility in other applications as well. Full article
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15 pages, 2426 KiB  
Article
EXtra-Xwiz: A Tool to Streamline Serial Femtosecond Crystallography Workflows at European XFEL
by Oleksii Turkot, Fabio Dall’Antonia, Richard J. Bean, Juncheng E, Hans Fangohr, Danilo E. Ferreira de Lima, Sravya Kantamneni, Henry J. Kirkwood, Faisal H. M. Koua, Adrian P. Mancuso, Diogo V. M. Melo, Adam Round, Michael Schuh, Egor Sobolev, Raphaël de Wijn, James J. Wrigley and Luca Gelisio
Crystals 2023, 13(11), 1533; https://doi.org/10.3390/cryst13111533 - 24 Oct 2023
Cited by 4 | Viewed by 2152
Abstract
X-ray free electron lasers deliver photon pulses that are bright enough to observe diffraction from extremely small crystals at a time scale that outruns their destruction. As crystals are continuously replaced, this technique is termed serial femtosecond crystallography (SFX). Due to its high [...] Read more.
X-ray free electron lasers deliver photon pulses that are bright enough to observe diffraction from extremely small crystals at a time scale that outruns their destruction. As crystals are continuously replaced, this technique is termed serial femtosecond crystallography (SFX). Due to its high pulse repetition rate, the European XFEL enables the collection of rich and extensive data sets, which are suited to study various scientific problems, including ultra-fast processes. The enormous data rate, data complexity, and the nature of the pixelized multimodular area detectors at the European XFEL pose severe challenges to users. To streamline the analysis of the SFX data, we developed the semiautomated pipeline EXtra-Xwiz around the established CrystFEL program suite, thereby processing diffraction patterns on detector frames into structure factors. Here we present EXtra-Xwiz, and we introduce its architecture and use by means of a tutorial. Future plans for its development and expansion are also discussed. Full article
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13 pages, 3382 KiB  
Article
Sample Delivery Systems for Serial Femtosecond Crystallography at the PAL-XFEL
by Jaehyun Park and Ki Hyun Nam
Photonics 2023, 10(5), 557; https://doi.org/10.3390/photonics10050557 - 10 May 2023
Cited by 9 | Viewed by 2604
Abstract
Serial femtosecond crystallography (SFX) using an X-ray free electron laser (XFEL) enables the determination of room-temperature structures without causing radiation damage. Using an optical pump-probe or mix-and-injection, SFX enables the intermediate state visualization of a molecular reaction. In SFX experiments, serial and stable [...] Read more.
Serial femtosecond crystallography (SFX) using an X-ray free electron laser (XFEL) enables the determination of room-temperature structures without causing radiation damage. Using an optical pump-probe or mix-and-injection, SFX enables the intermediate state visualization of a molecular reaction. In SFX experiments, serial and stable microcrystal delivery to the X-ray interaction point is vital for reasonable data collection and efficient beam time. The Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) facility established SFX instruments at a nanocrystallography and coherent imaging (NCI) experimental station. Various sample delivery methods, including injection, fixed-target scanning, and hybrid methods, have been developed and applied to collect XFEL diffraction data. Herein, we report the currently available sample delivery methods for SFX at the NCI experimental station at the PAL-XFEL. This article will help PAL-XFEL users access the SFX system for their experiments. Full article
(This article belongs to the Special Issue XUV and X-ray Free-Electron Lasers and Applications)
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15 pages, 5235 KiB  
Article
Dispersion Caused by the Penetration Effect in X-ray Compressors
by Chuan Yang, Kai Hu, Ye Zhu, Xiaofan Wang, Qinming Li, Zhongmin Xu, Juhao Wu and Weiqing Zhang
Photonics 2023, 10(5), 484; https://doi.org/10.3390/photonics10050484 - 23 Apr 2023
Cited by 5 | Viewed by 2344
Abstract
Chirped X-ray pulse compression is a promising approach for generating ultra-short X-ray free electron laser (XFEL) pulses. The design of X-ray pulse compressors requires the careful control of group delay dispersion (GDD), which plays a critical role in achieving optimal compression. However, the [...] Read more.
Chirped X-ray pulse compression is a promising approach for generating ultra-short X-ray free electron laser (XFEL) pulses. The design of X-ray pulse compressors requires the careful control of group delay dispersion (GDD), which plays a critical role in achieving optimal compression. However, the penetration dispersion of crystals and multilayers can induce an extra GDD, which may result in over-compression or under-compression. In this study, we investigate the penetration dispersion of crystals and multilayers theoretically and numerically. Our results indicate that the extra GDD induced by the penetration effect increases as the bandwidth of the rocking curve decreases. Moreover, the extra GDD is nonlinear and can be mitigated by optimizing the configuration of X-ray pulse compressors. This work provides insights into the dispersion compensation and configuration optimization of X-ray pulse compressors, which are essential for generating ultra-short XFEL pulses. Full article
(This article belongs to the Special Issue XUV and X-ray Free-Electron Lasers and Applications)
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19 pages, 6377 KiB  
Article
Temporal Response of Atoms Trapped in an Optical Dipole Trap: A Primer on Quantum Computing Speed
by S. Baral, Raghavan K. Easwaran, J. Jose, Aarthi Ganesan and P. C. Deshmukh
Atoms 2023, 11(4), 72; https://doi.org/10.3390/atoms11040072 - 10 Apr 2023
Cited by 1 | Viewed by 2654
Abstract
An atom confined in an optical dipole trap is a promising candidate for a qubit. Analyzing the temporal response of such trapped atoms enables us to estimate the speed at which quantum computers operate. The present work models an atom in an optical [...] Read more.
An atom confined in an optical dipole trap is a promising candidate for a qubit. Analyzing the temporal response of such trapped atoms enables us to estimate the speed at which quantum computers operate. The present work models an atom in an optical dipole trap formed using crossed laser beams and further examines the photoionization time delay from such confined atoms. We study noble gas atoms, such as Ne (Z = 10), Ar (Z = 18), Kr (Z = 36), and Xe (Z = 54). The atoms are considered to be confined in an optical dipole trap using X-ray Free Electron Lasers (XFEL). The present work shows that the photoionization time delay of the trapped atoms is different compared with that of the free atoms. This analysis alerts us that while talking about the speed of quantum computing, the temporal response of the atoms in the trapped environment must also be accounted for. Full article
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