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New Developments and Applications of Advanced Microscopy in the Biological and Material Sciences. A Special Issue Derived from MFS2019 (Microscopy at the Frontiers of Science. Joint Meeting of the Spanish and Portuguese Societies of Microscopy)
Special Issue Information
Dear Colleagues,
This Special Issue on “New Developments and Applications of Advanced Microscopy in the Biological and Material Sciences” derives from MFS2019, the Microscopy at the Frontiers of Science Series of Joint Meetings of the Spanish and Portuguese Societies of Microscopy celebrated in Granada (Spain), 11–13 September 2019. We welcome contributions in the form of review articles and original research manuscripts, not restricted to participants of the meeting but also from interested field-related authors. Topics covered within the congress and also by the present volume include all kinds of microscopical and related disciplines, in both the Life Sciences and the Material Sciences. Descriptions and applications of instrumental adaptations and new technological developments are also welcome. Reports of imaging protocols and image analysis and improvement strategies and data curation are likewise encouraged.
Submitted articles should provide, as requested by the journal, background information, full experimental details, and comparison with available protocols/methods. The topic fits extremely well with the suggestion of the journal of submitting accompanying video demonstrations, which will be published online. The journal has no restriction on the length of the papers, and publication charges will be waived for the proposed Special Issue. Do not miss this opportunity to publicize your innovative work.
Dr. Juan de Dios Alché Ramírez
Prof. Dr. Jordi Arbiol
Dr. Dra. Erin Tranfield
Prof. Bruno Trindade
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Methods and Protocols is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- 3-D EM
- 4Pi microscopy
- Aberration correction
- Array tomography (AT)
- Atomic force microscopy (AFM)
- Automated processing
- Big data
- Bioluminescence imaging (BLI)
- Brightfield and other transmission microscopy contrasts
- Clearing
- Colocalization
- Correlated light and electron microscopy (CLEM)
- Cryo-electron microscopy
- Data mining
- Detectors
- Dyes design
- Electron tomography
- Fluorescence correlation spectroscopy (FCS)
- Fluorescence lifetime imaging microscopy (FLIM)
- Focused ion beam SEM (FIBSEM)
- Förster resonance energy transfer (FRET)
- High-content screening (HCS)
- High-resolution TEM, STEM, SEM and diffraction
- High-speed confocal laser scanning microscopy (CLSM)
- High-voltage electron microscopy
- Hyperspectral imaging
- Image analysis
- Image analysis/colocalization
- Image analysis/software
- Image analysis/deconvolution
- In situ EM
- In vivo imaging
- Light sheet microscopy (SPIM, DSLM, DiSPIM)
- Low-energy electron microscopy—STEM, TEM, SEM, FIB, EELS, EFTEM, EDX, CL
- Machine learning
- Mesoscopic imaging
- Multiplex imaging
- Multiscale imaging
- Nonlinear microscopy (TPEF, SHG, THG)
- Optical tweezers
- Phase-related techniques
- Photoexcitation and photoablation
- Serial block face SEM (SBEM)
- Single molecules detection
- Super resolution microscopy (STED, STORM, PALM, structured illumination)
- Tissue imaging
- X-ray tomography
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