Artificial Intelligence and Intelligent Signal Processing in Precision Measurement
A special issue of Mathematics (ISSN 2227-7390). This special issue belongs to the section "E1: Mathematics and Computer Science".
Deadline for manuscript submissions: 14 June 2026 | Viewed by 5
Special Issue Editors
Interests: machine vision inspection; laser measurement; vibration measurement; motion control and testing
Special Issue Information
Dear Colleagues,
With the rapid development of artificial intelligence and intelligent signal processing technologies, significant progress has been made in precision measurement and instruments, and they have been widely applied in intelligent manufacturing, structural health monitoring, fault diagnosis, and intelligent medical fields.
Artificial intelligence and intelligent signal processing, as the core of intelligent detection instruments and equipment, through in-depth analysis and mining of data features, form data-driven intelligent detection methods and systems, which possess excellent accuracy and repeatability and demonstrate unprecedented advantages. This Special Issue addresses data differences in various engineering applications by highlighting theories and methods based on artificial intelligence and signal processing. A complete process system integrating data anomaly judgment, preprocessing, feature extraction and enhancement, model selection and construction, and training and validation is established, aiming to meet the intelligent and reliable detection requirements of different engineering applications.
This Special Issue focuses on the theories, methods and technologies of artificial intelligence and intelligent signal processing, as well as their applications in precision measurement and instruments. It provides a platform for the exchange of innovative ideas and intelligent methods and technologies across different disciplines and promotes the application of precision measurement and instruments in various fields.
Dr. Ming Yang
Dr. Ying Wang
Guest Editors
Manuscript Submission Information
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Keywords
- neural network
- deep learning
- machine learning
- expert system
- computer application
- intelligent signal processing
- sensing measurement
- reliable metrology
- intelligent instrumentation
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