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Journal: Microelectronics, 2026
Volume: 2
Number: 12
Article:
EMI-Induced Eye Diagram Degradation in CMOS Inverter: Experimental Analysis and Predictive Modeling
Authors:
by
Mohammad Abedi, Zahra Abedi, Sameer Hemmady, Edl Schamiloglu and Payman Zarkesh-Ha
Link:
https://www.mdpi.com/3042-5344/2/3/12
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