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Article

Analysis of the Influence of the Anti-Reflective Layer on the Accuracy Assessment of Spherical Elements Manufactured by Selected Additive Methods in the ASPECT of Optical Measurements

by
Małgorzata Gontarz-Kulisiewicz
*,
Tomasz Dziubek
,
Grzegorz Budzik
,
Łukasz Przeszłowski
and
Bartłomiej Sobolewski
Department of Machine Design, Faculty of Mechanical Engineering and Aeronautics, Rzeszów University of Technology, Al. Powstańców Warszawy 12, 35-029 Rzeszów, Poland
*
Author to whom correspondence should be addressed.
Metrology 2026, 6(3), 64; https://doi.org/10.3390/metrology6030064 (registering DOI)
Submission received: 9 July 2026 / Revised: 14 August 2026 / Accepted: 10 September 2026 / Published: 12 September 2026

Abstract

This article presents an analysis of the effect of an anti-reflective layer on the measurement process using the 3D GOM (ATOS II Triple Scan; currently ZEISS) optical scanner for spherical elements manufactured using four additive methods: PolyJet Modeling (PJM), Digital Light Processing (DLP), Melted Extrusion Modeling (MEM), and Direct Metal Laser Sintering (DMLS). The research focused on analyzing the effect of the anti-reflective (AR) layer on changes in numerical data and on differences that define the shape of the measured elements. It was noted that models made of light-cured resin (EC100 (DLP) and RGD720 (PJM)) were characterized by AR layer absorption, which affected the measurement results. The use of the AR layer also increases the number of points for which a fitted sphere is created in the optical scanner software for shape analysis of the research models. The application of the AR layer also affects the average dimensional deviations (relative to the MB1 and MB2 research models), most significantly for models made using the PJM and MEM methods (approx. 0.02 mm), and least significantly for models made using the DMLS method (approx. 0.004 mm). The conducted research, presented measurement results, analyses, and conclusions, will help predict the impact of using the AR layer on the measurement process and the accuracy of the obtained results of measured geometric parameters during 3D GOM (ATOS II Triple Scan) optical measurements of models made of selected materials.
Keywords: metrology; measurement; 3D printing; anti-reflective layer; scanner 3D; geometric accuracy metrology; measurement; 3D printing; anti-reflective layer; scanner 3D; geometric accuracy

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MDPI and ACS Style

Gontarz-Kulisiewicz, M.; Dziubek, T.; Budzik, G.; Przeszłowski, Ł.; Sobolewski, B. Analysis of the Influence of the Anti-Reflective Layer on the Accuracy Assessment of Spherical Elements Manufactured by Selected Additive Methods in the ASPECT of Optical Measurements. Metrology 2026, 6, 64. https://doi.org/10.3390/metrology6030064

AMA Style

Gontarz-Kulisiewicz M, Dziubek T, Budzik G, Przeszłowski Ł, Sobolewski B. Analysis of the Influence of the Anti-Reflective Layer on the Accuracy Assessment of Spherical Elements Manufactured by Selected Additive Methods in the ASPECT of Optical Measurements. Metrology. 2026; 6(3):64. https://doi.org/10.3390/metrology6030064

Chicago/Turabian Style

Gontarz-Kulisiewicz, Małgorzata, Tomasz Dziubek, Grzegorz Budzik, Łukasz Przeszłowski, and Bartłomiej Sobolewski. 2026. "Analysis of the Influence of the Anti-Reflective Layer on the Accuracy Assessment of Spherical Elements Manufactured by Selected Additive Methods in the ASPECT of Optical Measurements" Metrology 6, no. 3: 64. https://doi.org/10.3390/metrology6030064

APA Style

Gontarz-Kulisiewicz, M., Dziubek, T., Budzik, G., Przeszłowski, Ł., & Sobolewski, B. (2026). Analysis of the Influence of the Anti-Reflective Layer on the Accuracy Assessment of Spherical Elements Manufactured by Selected Additive Methods in the ASPECT of Optical Measurements. Metrology, 6(3), 64. https://doi.org/10.3390/metrology6030064

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