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Journal: Metrology, 2025
Volume: 5
Number: 19
19
Article: Enhanced Vectorial Measurement Uncertainty Model
Authors: by Ingo Ortlepp, Simon Eisele, Kevin Treptow, Josias Rühle, Christof Pruß, Tobias Haist, Stephan Reichelt, Oliver Sawodny, Eberhard Manske and Thomas Kissinger
Link: https://www.mdpi.com/2673-8244/5/2/19

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