Article Versions Notes

Ortlepp I, Eisele S, Treptow K, Rühle J, Pruß C, Haist T, Reichelt S, Sawodny O, Manske E, Kissinger T. Enhanced Vectorial Measurement Uncertainty Model. Metrology. 2025; 5(2):19. https://doi.org/10.3390/metrology5020019

Ortlepp, Ingo, Simon Eisele, Kevin Treptow, Josias Rühle, Christof Pruß, Tobias Haist, Stephan Reichelt, Oliver Sawodny, Eberhard Manske, and Thomas Kissinger. 2025. "Enhanced Vectorial Measurement Uncertainty Model" Metrology 5, no. 2: 19. https://doi.org/10.3390/metrology5020019

Ortlepp, I., Eisele, S., Treptow, K., Rühle, J., Pruß, C., Haist, T., Reichelt, S., Sawodny, O., Manske, E., & Kissinger, T. (2025). Enhanced Vectorial Measurement Uncertainty Model. Metrology, 5(2), 19. https://doi.org/10.3390/metrology5020019