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Journal: Metrology, 2024
Volume: 4
Number: 10

Article: Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps
Authors: by Clement Moreau, Julie Lemesle, David Páez Margarit, François Blateyron and Maxence Bigerelle
Link: https://www.mdpi.com/2673-8244/4/2/10

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