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Journal: MicroVolume: 2Number: 31
Article: Non-Destructive Characterization of Selected Types of Films and Other Layers via White Light Reflectance Spectroscopy (WLRS)
- Authors:
- Dimitrios Goustouridis1,
- Ioannis Raptis1,2,* and
- Theodora Mpatzaka1
- et al.
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