Goustouridis, D.; Raptis, I.; Mpatzaka, T.; Fournari, S.; Zisis, G.; Petrou, P.; Beltsios, K.G.
Non-Destructive Characterization of Selected Types of Films and Other Layers via White Light Reflectance Spectroscopy (WLRS). Micro 2022, 2, 495-507.
https://doi.org/10.3390/micro2030031
AMA Style
Goustouridis D, Raptis I, Mpatzaka T, Fournari S, Zisis G, Petrou P, Beltsios KG.
Non-Destructive Characterization of Selected Types of Films and Other Layers via White Light Reflectance Spectroscopy (WLRS). Micro. 2022; 2(3):495-507.
https://doi.org/10.3390/micro2030031
Chicago/Turabian Style
Goustouridis, Dimitrios, Ioannis Raptis, Theodora Mpatzaka, Savvina Fournari, Grigorios Zisis, Panagiota Petrou, and Konstantinos G. Beltsios.
2022. "Non-Destructive Characterization of Selected Types of Films and Other Layers via White Light Reflectance Spectroscopy (WLRS)" Micro 2, no. 3: 495-507.
https://doi.org/10.3390/micro2030031
APA Style
Goustouridis, D., Raptis, I., Mpatzaka, T., Fournari, S., Zisis, G., Petrou, P., & Beltsios, K. G.
(2022). Non-Destructive Characterization of Selected Types of Films and Other Layers via White Light Reflectance Spectroscopy (WLRS). Micro, 2(3), 495-507.
https://doi.org/10.3390/micro2030031
