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Journal: Electron. Mater., 2024
Volume: 5
Number: 9
132-144
Article: Alternative Measurement Approach for the Evaluation of Hot-Electron Degradation in p-GaN Gate AlGaN/GaN Power HEMTs
Authors: by Marcello Cioni, Giovanni Giorgino, Alessandro Chini, Antonino Parisi, Giacomo Cappellini, Cristina Miccoli, Maria Eloisa Castagna, Cristina Tringali and Ferdinando Iucolano
Link: https://www.mdpi.com/2673-3978/5/3/9

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