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Journal: Electronic MaterialsVolume: 5Number: 6
Article: The Switching Characteristics in Bilayer ZnO/HfO2 Resistive Random-Access Memory, Depending on the Top Electrode
  • Authors:
  • So-Yeon Kwon,
  • Woon-San Ko and
  • Jun-Ho Byun
  • et al.
Link: https://www.mdpi.com/2673-3978/5/2/6

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