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Journal: Electron. Mater., 2024
Volume: 5
Number: 6
Article:
The Switching Characteristics in Bilayer ZnO/HfO2 Resistive Random-Access Memory, Depending on the Top Electrode
Authors:
by
So-Yeon Kwon, Woon-San Ko, Jun-Ho Byun, Do-Yeon Lee, Hi-Deok Lee and Ga-Won Lee
Link:
https://www.mdpi.com/2673-3978/5/2/6
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