Zhou, Y.; Zhuang, S.; Sheng, A.; Ge, Y.; Zhu, J.; Wang, Z.; Lei, Y.; Cao, X.
Spot-Weld Defect Detection with YOLOv8n Integrating Multi-Receptive-Field Attention and Structural Re-Parameterization. AI 2026, 7, 379.
https://doi.org/10.3390/ai7090379
AMA Style
Zhou Y, Zhuang S, Sheng A, Ge Y, Zhu J, Wang Z, Lei Y, Cao X.
Spot-Weld Defect Detection with YOLOv8n Integrating Multi-Receptive-Field Attention and Structural Re-Parameterization. AI. 2026; 7(9):379.
https://doi.org/10.3390/ai7090379
Chicago/Turabian Style
Zhou, Yuxuan, Shudong Zhuang, Ao Sheng, Yizheng Ge, Jiarui Zhu, Zhizhou Wang, Yuxian Lei, and Xinyan Cao.
2026. "Spot-Weld Defect Detection with YOLOv8n Integrating Multi-Receptive-Field Attention and Structural Re-Parameterization" AI 7, no. 9: 379.
https://doi.org/10.3390/ai7090379
APA Style
Zhou, Y., Zhuang, S., Sheng, A., Ge, Y., Zhu, J., Wang, Z., Lei, Y., & Cao, X.
(2026). Spot-Weld Defect Detection with YOLOv8n Integrating Multi-Receptive-Field Attention and Structural Re-Parameterization. AI, 7(9), 379.
https://doi.org/10.3390/ai7090379
