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Article

Multi-Channel Monitoring System with Nanosecond Resolution for Intermittent Faults in Electrical Connectors

1
School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China
2
Aviation Key Laboratory of Science and Technology on Aero Combined Environment, Department of Frontier Technology Research, China Aero-Polytechnology Establishment, Beijing 100028, China
3
School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150001, China
*
Author to whom correspondence should be addressed.
Inventions 2026, 11(3), 64; https://doi.org/10.3390/inventions11030064
Submission received: 25 May 2026 / Revised: 12 June 2026 / Accepted: 15 June 2026 / Published: 17 June 2026
(This article belongs to the Special Issue Recent Advances and New Trends in Signal Processing: 2nd Edition)

Abstract

Intermittent faults in electrical connectors refer to cases in which contact resistance exceeds a specified threshold for microseconds or less, causing transient power or signal interruptions. Accurate detection and quantitative recording of these events are important for connector reliability evaluation. In this work, an eight-channel monitoring system with nanosecond resolution for intermittent faults in electrical connectors is developed, enabling quantitative recording of intermittent events together with dynamic contact resistance (DCR) waveform acquisition. Two-stage programmable amplification is used for DCR measurement, while threshold comparison and FPGA-abased quadrature multiphase oversampling are combined to capture intermittent events. The system supports DCR measurement over 1 mΩ–10,000 mΩ with a maximum relative error of 0.41%, and provides 1.25 ns equivalent time resolution for intermittent event monitoring, with an expanded uncertainty of 0.28 ns–0.54 ns over 20 ns–10 μs. Vibration tests on high-speed connectors further demonstrate that the system captures real intermittent events under mechanical excitation and measures their durations with a maximum relative error of 0.66% relative to oscilloscope results.
Keywords: intermittent fault; dynamic contact resistance; electrical connectors intermittent fault; dynamic contact resistance; electrical connectors

Share and Cite

MDPI and ACS Style

Ren, W.; Liao, Y.; Zhang, Y.; Meng, Y.; Zhang, C. Multi-Channel Monitoring System with Nanosecond Resolution for Intermittent Faults in Electrical Connectors. Inventions 2026, 11, 64. https://doi.org/10.3390/inventions11030064

AMA Style

Ren W, Liao Y, Zhang Y, Meng Y, Zhang C. Multi-Channel Monitoring System with Nanosecond Resolution for Intermittent Faults in Electrical Connectors. Inventions. 2026; 11(3):64. https://doi.org/10.3390/inventions11030064

Chicago/Turabian Style

Ren, Wanbin, Yuchen Liao, Yinnan Zhang, Yuan Meng, and Chao Zhang. 2026. "Multi-Channel Monitoring System with Nanosecond Resolution for Intermittent Faults in Electrical Connectors" Inventions 11, no. 3: 64. https://doi.org/10.3390/inventions11030064

APA Style

Ren, W., Liao, Y., Zhang, Y., Meng, Y., & Zhang, C. (2026). Multi-Channel Monitoring System with Nanosecond Resolution for Intermittent Faults in Electrical Connectors. Inventions, 11(3), 64. https://doi.org/10.3390/inventions11030064

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