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Volume 9
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10.3390/c9030062
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Article

Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy

by
Sergey P. Lebedev
*,
Ilya A. Eliseyev
,
Mikhail S. Dunaevskiy
,
Ekaterina V. Gushchina
and
Alexander A. Lebedev
Ioffe Institute, 26 Politekhnicheskaya, St. Petersburg 194021, Russia
*
Author to whom correspondence should be addressed.
C 2023, 9(3), 62; https://doi.org/10.3390/c9030062
Submission received: 17 April 2023 / Revised: 13 June 2023 / Accepted: 16 June 2023 / Published: 21 June 2023
(This article belongs to the Special Issue Advances in Modelling of Size Effects in Graphene and Carbon Nanotubes)
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Abstract

A new technique for determining the point spread function, which is required for measuring the surface potential using Kelvin probe microscopy (KPM), is presented. The method involves using a silicon carbide substrate coated with single-layer and bilayer graphene as a test structure and obtaining KPM potential profiles in different directions on the surface. This makes it possible to determine the KPM point spread function, which can be used to perform deconvolution and accurately recover the surface potential.
Keywords: scanning probe microscopy; Kelvin probe microscopy; graphene; SiC; thin films scanning probe microscopy; Kelvin probe microscopy; graphene; SiC; thin films

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MDPI and ACS Style

Lebedev, S.P.; Eliseyev, I.A.; Dunaevskiy, M.S.; Gushchina, E.V.; Lebedev, A.A. Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy. C 2023, 9, 62. https://doi.org/10.3390/c9030062

AMA Style

Lebedev SP, Eliseyev IA, Dunaevskiy MS, Gushchina EV, Lebedev AA. Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy. C. 2023; 9(3):62. https://doi.org/10.3390/c9030062

Chicago/Turabian Style

Lebedev, Sergey P., Ilya A. Eliseyev, Mikhail S. Dunaevskiy, Ekaterina V. Gushchina, and Alexander A. Lebedev. 2023. "Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy" C 9, no. 3: 62. https://doi.org/10.3390/c9030062

APA Style

Lebedev, S. P., Eliseyev, I. A., Dunaevskiy, M. S., Gushchina, E. V., & Lebedev, A. A. (2023). Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy. C, 9(3), 62. https://doi.org/10.3390/c9030062

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