Yu, Q.;                     Wang, C.;                     Zhang, Y.;                     Hu, S.;                     Liu, T.;                     Cheng, F.;                     Wang, Y.;                     Lin, T.;                     Xi, L.    
        Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination. Photonics 2022, 9, 155.
    https://doi.org/10.3390/photonics9030155
    AMA Style
    
                                Yu Q,                                 Wang C,                                 Zhang Y,                                 Hu S,                                 Liu T,                                 Cheng F,                                 Wang Y,                                 Lin T,                                 Xi L.        
                Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination. Photonics. 2022; 9(3):155.
        https://doi.org/10.3390/photonics9030155
    
    Chicago/Turabian Style
    
                                Yu, Qing,                                 Chong Wang,                                 Yali Zhang,                                 Shengming Hu,                                 Ting Liu,                                 Fang Cheng,                                 Yin Wang,                                 Tianliang Lin,                                 and Lin Xi.        
                2022. "Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination" Photonics 9, no. 3: 155.
        https://doi.org/10.3390/photonics9030155
    
    APA Style
    
                                Yu, Q.,                                 Wang, C.,                                 Zhang, Y.,                                 Hu, S.,                                 Liu, T.,                                 Cheng, F.,                                 Wang, Y.,                                 Lin, T.,                                 & Xi, L.        
        
        (2022). Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination. Photonics, 9(3), 155.
        https://doi.org/10.3390/photonics9030155