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Letter

One-Way Zero Reflection in an Insulator-Metal-Insulator Structure Using the Transfer Matrix Method

by 1 and 2,*
1
Department of Physics, Kookmin University, Seoul 02707, Korea
2
Division of Science Education, Jeonbuk National University, Jeonju 54896, Korea
*
Author to whom correspondence should be addressed.
Photonics 2021, 8(1), 8; https://doi.org/10.3390/photonics8010008
Received: 11 December 2020 / Revised: 25 December 2020 / Accepted: 29 December 2020 / Published: 31 December 2020
(This article belongs to the Special Issue Recent Advances in the Study of Light Propagation in Optical Fibers)
We numerically demonstrate one-way zero reflection using the transfer matrix method. Using simulations, we adjusted the thickness of SiO2 layers in a simple SiO2-Au-SiO2 layer structure. We found two solutions, 47 nm-10 nm-32 nm and 71 nm-10 nm-60 nm, which are the thicknesses for one-way zero reflection at a wavelength of 560 nm. We confirmed it with reflection spectra, where reflectance is zero for forwardly incident light and 2.5% for backwardly incident light at the wavelength 560 nm, and thickness 47 nm-10 nm-32 nm. View Full-Text
Keywords: reflection; absorption; PT-symmetry reflection; absorption; PT-symmetry
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MDPI and ACS Style

Noh, H.; Choi, J.-M. One-Way Zero Reflection in an Insulator-Metal-Insulator Structure Using the Transfer Matrix Method. Photonics 2021, 8, 8. https://doi.org/10.3390/photonics8010008

AMA Style

Noh H, Choi J-M. One-Way Zero Reflection in an Insulator-Metal-Insulator Structure Using the Transfer Matrix Method. Photonics. 2021; 8(1):8. https://doi.org/10.3390/photonics8010008

Chicago/Turabian Style

Noh, Heeso, and Jai-Min Choi. 2021. "One-Way Zero Reflection in an Insulator-Metal-Insulator Structure Using the Transfer Matrix Method" Photonics 8, no. 1: 8. https://doi.org/10.3390/photonics8010008

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