1. Introduction
Studies of spectra changes in free space propagation have been performed extensively over recent decades [
1,
2]. There is a scaling law (Wolf effect) stating that the spectral variations exist unless the degree of spectral coherence of the source meets that law [
3]. Since then, other mechanisms causing spectral changes have been discussed, such as photorefractive material interactions [
4], spectral correlation [
5], and aperture diffraction [
6]. Many interesting and valuable results were obtained through such studies, such as spectral switches [
7], lattice spectroscopy [
8], spectral anomalies [
9], Fresnel zone spectra [
10], Talbot spectra [
11], spectra restoration [
12], and manipulation [
13]. An important relation called the spatial-spectral correspondence relationship for mono-polychromatic light diffraction was proposed by one of the authors [
10], which has been used widely to derive those results. It states that, for aperture diffraction of fully coherent and uniform incident light, the space intensity distribution (in spatial domain) of monochromatic light corresponds to the spectrum distribution (in spectral domain) of polychromatic light. However, this relation is used mainly in the paraxial regime, i.e., the near-field zone (with Fresnel approximation) and far-field zone (with Fraunhoffer approximation). The reason is that, for ordinary two-dimensional aperture diffraction, the Huygens integral can only be reduced to a functional form with the above two approximations, leading to the Fresnel integral and Fourier optics, respectively. By doing so, the relation between the spatial and spectral domains is more direct and clearer. Some previous works used numerical methods to study two-dimensional apertures diffraction in non-paraxial regimes [
14,
15]. Single-slit focusing and its representation has been studied [
16]. Nevertheless, it is known that there is a functional form in the non-paraxial region for the one-dimension slit, which makes the correspondence relation applicable again. This is of importance because, for visible-NIR light sources with micrometer-order wavelength, the non-paraxial regime is in the wavelength range or even sub-wavelength regions. The results derived in that regime are valuable to those who study micro- or nano-optics in the very near vicinity of the slit.
In this work, we first study the Fresnel-Kirchhoff integral functional form for slit diffraction. The space behind the slit is further divided into four zones, covering both paraxial and non-paraxial regions. Each zone’s diffraction form is given and the boundary between the two adjacent zones is described. Since we are mainly interested in the non-paraxial region (i.e., Zones 1 and 2), some numerical examples illustrate the characteristics of spatial intensities in those two zones. Following that is the usage of the correspondence relationship to transfer monochromatic intensity in spatial domain to polychromatic spectrum in spectral domain. In Zone 1, we can find three spectral effects: spectral switches, multi-level data transmission scheme, and optical wavelength ruler. These results are of value for spectrum control studies or applications in non-paraxial region.
2. Theory and Spatial Intensity
In the scalar wave optics regime, the aperture diffraction phenomena can be described satisfactorily with the Huygens–Fresnel principle as
where
,
is the wavelength,
is the aperture and
is the surface integration to it, the wavenumber is
,
is the distance from a point
to the point
with
, and
and
are the field amplitude on the aperture plane and detected plane at
, respectively. The coordinates system and symbols are denoted in
Figure 1. For monochromatic light with constant amplitude over the aperture, i.e.,
, the diffracted field can be reduced to
where
is the aperture function. In the paraxial regime and for two-dimensional aperture cases, functional form of Equation (2) such as the Fresnel integral or the Fourier optics can be obtained only after the near-field (Fresnel) approximation or the far-field (Fraunhofer) approximation is applied to Equation (2). That is why the correspondence relationship is discussed in the paraxial regime thus far. However, as shown below, in the one-dimensional slit case, the functional form can still be obtained without any approximation; thus, the correspondence relationship can also be presented in the non-paraxial regime. This is of great value for studying spatial intensity distribution and spectra manipulation of the mono/polychromatic diffracted light in the non-paraxial regime, especially in the region very close to the aperture, i.e., in the order of wavelength or even subwavelength regions.
As shown in
Figure 1, the aperture now is a one-dimensional
width slit along
y’ and that reduces the aperture function
into
with
, where
is the rectangle function with
= 1 for
and
= 0 otherwise. Using this one-dimensional situation, Equation (2) can be simplified as
The bracket in the Equation (3) integration can be derived as a functional form [
17] as
where
is the zero-order Hankel function of the first kind with
and
, as shown in
Figure 1;
is the zero-order Bessel function of the first kind; and
is the zero-order Newman function of the first kind. Their properties are plotted in
Figure 2. Note the oscillating and decaying behavior. In addition, the properties of
and
near the origin are quite different.
Substituting Equation (4) into Equation (3), we have the so-called one-dimensional Fresnel–Kirchhoff diffraction formula,
This functional form of
is essentially valid in all the space behind the aperture because no approximations are used. However, it is customary to divide the space into two regions (non-paraxial and paraxial region) and four zones, as shown in
Figure 3. For each zone, different conditions or approximations are employed, and the corresponding functional form can be derived. To facilitate the discussion of those circumstances, the space behind the aperture is divided into four zones, as illustrated in
Figure 3, and all the physical quantiles derived in zone I (I = 1, 2, 3, 4) are indicated with a subscript (I). For example,
is the field in Zone 1, and similar notations are adapted in other zones. The boundaries B1, B2, and B3 between adjacent zones are discussed in the following.
(A) Zone 1
As explained above, in Zone 1, Equation (5) is used to calculate the diffracted field as
where
is explicitly indicated as the up and down limit of the integral and
The diffracted intensity distribution
is
The reason to use the symbols
and
is that the asymptotic behavior for
and
is similar to that of the cosine and sine functions, respectively, as shown in
Figure 2. Actually, when
, they can be approximated, respectively, as [
18]
(B) Zone 2
We enter into Zone 2 when
; using Equation (7), the Hankel function can be approximated as
Substituting Equation (8) into Equation (5), we have
where
The diffracted intensity distribution
is
(C) Zone 3 (Fresnel region)
When
, where
is the angle made between the vector
and
z axis (see
Figure 1), we enter the paraxial region. There are two zones, near field (Zone 3) and far field (Zone 4). For Zone 3, the criterion is
[
19], where
is the maximum angle and
is the Fresnel number. In this slit case,
, we have the condition
from the above inequality. Under this condition, the variable
can be approximated as
(the Fresnel approximation) and the diffracted field is
where
The diffracted intensity distribution
is
This corresponds to the one-dimensional slit near-field diffraction. The first line of Equation (10a) is related to the Fresnel integral as , where and are called the Fresnel cosine integral and sine integral, respectively. By plotting them in a complex plane, they form the curve of , the so-called Cornu spiral.
(D) Zone 4
Finally, when
, i.e.,
, it is in Zone 4 and
can be further approximated as
(the Fraunhofer approximation) and the diffracted field is
where the sinc function is defined as
and
is the Fourier transform of the aperture function
with the spatial frequency
. This corresponds to the one-dimensional far-field diffraction, or the Fourier optics. The intensity distribution is
Figure 3 illustrates the four zones, and the correct functional forms are provided above. Note that
can be employed not only in Zone 1, but also in all subsequent zones, because no approximations are used. Likewise,
can be used in Zones 2–4 but not Zone 1 because, when the approximation
is used,
degenerates into
. However, if we use
to calculate the field in Zone 1, it cannot give correct answer. Similar reasoning can be applied to
and
.
Since all the field representations are derived in each of the four zones, let us discuss more specific boundaries from the approximations used above. To estimate the proper boundary between zones, the following criterion is used: when an approximation requires “
” (i.e.,
a is much larger than
), it is simply interpreted as
is at least an order of magnitude larger than
, i.e.,
. Here, two arbitrary symbols
a and
b are used to explain the condition
; do not be confused with
a here and the slit width
2a. For example, the approximation used in Zone 2 is
, which is
; thus, for the worst case when
P and
P’ have the same
x component (i.e.,
), the distance
z still needs to satisfy the condition
. Using the criterion above,
means
, thus the boundary between Zones 1 and 2 (B1 in
Figure 3) is about 1.6 wavelengths. Using the same criterion, the approximation used in Zone 3 is
, leading to boundary B2 being
. The approximation used in Zone 4 is
, thus boundary B3 is
. To discuss the diffraction situations and boundaries more specifically, some practical numbers and numerical examples are helpful. A slit width
and wavelength
were arbitrarily chosen and are used in all of the following figures unless specified otherwise. Substituting
and
into above boundary estimations, we have the values of
z at 1.6, 13.8, and 32.4 μm for B1, B2, and B3, respectively, as indicated in
Figure 3. Since the slit diffraction in paraxial region was studied, we focus on the diffraction in the non-paraxial region, that is, Zones 1 and 2. Using Equation (6a) for
and Equation (9a) for
,
Figure 4a,b plots
,
in red solid lines, and
,
in blue circles on a complex number plane in the interval of
at two values of
z. The horizontal axis and vertical axis represent the real and imaginary parts of the diffracted field
. The magnitude of
(or the square root of the intensity
) can be obtained by finding the distance between the two corresponding points [
,
] and [
,
] for the specified
x value on the curve. The curves are plotted at two different locations of
z:
Figure 4a is at
z = 0.1 μm (Zone 1) and
Figure 4b is at
z =
(Zone 2). As mentioned above, in Zone 1, the
blue curve fails to fit the correct
red curve, because Equation (9a) for
is not applicable in Zone 1. However, for
Figure 4b in Zone 2, the two curves coincide nicely, because Equation (6a) for
and Equation (9a) for
both can be used in Zone 2. The situation is clarified when we plot the diffraction intensity directly, as shown in
Figure 5, where
Figure 5a is in Zone 1 (
z = 0.1 μm), using Equation (6c) for
(red line) and using Equation (9c) for
(blue line). It is seen that
is too large in the slit region and deviates from
in Zone 1, because Equation (9c) is not applicable in Zone 1. This is clearer in
Figure 5b where the same location z = 0.1 μm is picked but
is used. We see that in
Figure 5b
not only deviates from
but gives wrong local maximum as indicated by the arrows shown in the figure. The local maximum for
is 1.082 at x = −0.864 um; the local maximum for
is 1.236 at x = −0.585 um.
Figure 5c is plotted at Zone 2 (
z = 2.5
); we see that the two intensities
and
coincide nicely, as expected.