Wu, J.; Cai, X.; Wei, J.; Wang, C.; Zhou, Y.; Sun, K.
A Measurement System with High Precision and Large Range for Structured Surface Metrology Based on Atomic Force Microscope. Photonics 2023, 10, 289.
https://doi.org/10.3390/photonics10030289
AMA Style
Wu J, Cai X, Wei J, Wang C, Zhou Y, Sun K.
A Measurement System with High Precision and Large Range for Structured Surface Metrology Based on Atomic Force Microscope. Photonics. 2023; 10(3):289.
https://doi.org/10.3390/photonics10030289
Chicago/Turabian Style
Wu, Junjie, Xiaoyu Cai, Jiasi Wei, Chen Wang, Yong Zhou, and Kaixin Sun.
2023. "A Measurement System with High Precision and Large Range for Structured Surface Metrology Based on Atomic Force Microscope" Photonics 10, no. 3: 289.
https://doi.org/10.3390/photonics10030289
APA Style
Wu, J., Cai, X., Wei, J., Wang, C., Zhou, Y., & Sun, K.
(2023). A Measurement System with High Precision and Large Range for Structured Surface Metrology Based on Atomic Force Microscope. Photonics, 10(3), 289.
https://doi.org/10.3390/photonics10030289