Li, C.; Xu, Y.; Sun, Z.; Liu, Y.; Zhang, J.; Li, F.
ParaTaintGX: Detecting Memory Corruption Vulnerabilities in SGX Applications via Parameter-Taint Model. Mathematics 2026, 14, 1007.
https://doi.org/10.3390/math14061007
AMA Style
Li C, Xu Y, Sun Z, Liu Y, Zhang J, Li F.
ParaTaintGX: Detecting Memory Corruption Vulnerabilities in SGX Applications via Parameter-Taint Model. Mathematics. 2026; 14(6):1007.
https://doi.org/10.3390/math14061007
Chicago/Turabian Style
Li, Chao, Yifan Xu, Zhe Sun, Yongjie Liu, Jun Zhang, and Fan Li.
2026. "ParaTaintGX: Detecting Memory Corruption Vulnerabilities in SGX Applications via Parameter-Taint Model" Mathematics 14, no. 6: 1007.
https://doi.org/10.3390/math14061007
APA Style
Li, C., Xu, Y., Sun, Z., Liu, Y., Zhang, J., & Li, F.
(2026). ParaTaintGX: Detecting Memory Corruption Vulnerabilities in SGX Applications via Parameter-Taint Model. Mathematics, 14(6), 1007.
https://doi.org/10.3390/math14061007