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Journal: Electronics, 2020
Volume: 9
Number: 1230

Article: Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs
Authors: by Peixiong Zhao, Tianqi Liu, Chang Cai, Ze He, Dongqing Li and Jie Liu
Link: https://www.mdpi.com/2079-9292/9/8/1230

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