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        Journal: Electronics, 2020
        Volume: 9 
                	Number: 1230 
                
        
        Article:
        Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs 
        Authors: 
       	by
                    Peixiong Zhao, Tianqi Liu, Chang Cai, Ze He, Dongqing Li and Jie Liu        
        Link:
        https://www.mdpi.com/2079-9292/9/8/1230
        
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