Pérez, E.; González Ossorio, Ó.; Dueñas, S.; Castán, H.; GarcÃa, H.; Wenger, C.
Programming Pulse Width Assessment for Reliable and Low-Energy Endurance Performance in Al:HfO2-Based RRAM Arrays. Electronics 2020, 9, 864.
https://doi.org/10.3390/electronics9050864
AMA Style
Pérez E, González Ossorio Ó, Dueñas S, Castán H, GarcÃa H, Wenger C.
Programming Pulse Width Assessment for Reliable and Low-Energy Endurance Performance in Al:HfO2-Based RRAM Arrays. Electronics. 2020; 9(5):864.
https://doi.org/10.3390/electronics9050864
Chicago/Turabian Style
Pérez, Eduardo, Óscar González Ossorio, Salvador Dueñas, Helena Castán, Héctor GarcÃa, and Christian Wenger.
2020. "Programming Pulse Width Assessment for Reliable and Low-Energy Endurance Performance in Al:HfO2-Based RRAM Arrays" Electronics 9, no. 5: 864.
https://doi.org/10.3390/electronics9050864
APA Style
Pérez, E., González Ossorio, Ó., Dueñas, S., Castán, H., GarcÃa, H., & Wenger, C.
(2020). Programming Pulse Width Assessment for Reliable and Low-Energy Endurance Performance in Al:HfO2-Based RRAM Arrays. Electronics, 9(5), 864.
https://doi.org/10.3390/electronics9050864